TRENCH GATE TYPE TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
First Claim
1. A trench gate type transistor comprising;
- a semiconductor layer having a trench formed therein;
a gate insulation film disposed in the trench and extending outside the trench so as to overlie a top surface of the semiconductor layer;
a gate electrode disposed on the gate insulation film; and
a body layer formed in the semiconductor layer so as to be in contact with the gate insulation film on a sidewall of the trench,the gate insulation film comprising a first gate insulation film having a first thickness in a portion in contact with the body layer and a second gate insulation film having a second thickness larger than the first thickness in a portion covering a top edge portion of the trench where the sidewall of the trench and the top surface of the semiconductor layer meet.
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Accused Products
Abstract
The invention provides a trench gate type transistor in which the gate leakage current is prevented and the gate capacitance is reduced. A trench is formed in an N− type semiconductor layer. A thin silicon oxide film is formed on a region of the N− type semiconductor layer for the active region of the transistor in the trench. On the other hand, a silicon oxide film which is thicker than the silicon oxide film is formed on a region not for the active region. Furthermore, a leading portion extending from inside the trench onto the outside thereof forms a gate electrode contacting the silicon oxide film. This provides a long distance between the gate electrode at the leading portion and the corner portion of the N− type semiconductor layer, thereby preventing the gate leakage current and reducing the gate capacitance.
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Citations
13 Claims
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1. A trench gate type transistor comprising;
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a semiconductor layer having a trench formed therein; a gate insulation film disposed in the trench and extending outside the trench so as to overlie a top surface of the semiconductor layer; a gate electrode disposed on the gate insulation film; and a body layer formed in the semiconductor layer so as to be in contact with the gate insulation film on a sidewall of the trench, the gate insulation film comprising a first gate insulation film having a first thickness in a portion in contact with the body layer and a second gate insulation film having a second thickness larger than the first thickness in a portion covering a top edge portion of the trench where the sidewall of the trench and the top surface of the semiconductor layer meet. - View Dependent Claims (2, 3)
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4. A method of manufacturing a trench gate type transistor, comprising:
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forming a trench in a semiconductor layer; forming an oxide film on a front surface of the semiconductor layer and in the trench by thermally oxidizing the semiconductor layer; removing the oxide film from an active region in the trench selectively; forming a first gate oxide film having a first thickness on the active region in the trench and a second gate oxide film having a second thickness larger than the first thickness on a non-active region by thermally oxidizing the semiconductor layer after the selective removal of the oxide film; forming a gate electrode on the first and second gate oxide films so as to occupy the trench and cover the second gate oxide film outside the trench; and forming a body layer in the semiconductor layer along the trench so as to be in contact with the first gate oxide film. - View Dependent Claims (5)
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6. A trench gate type transistor comprising:
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a semiconductor layer having a trench formed therein; a gate insulation film disposed in the trench; a thick insulation film disposed in an end portion of the trench so as to be in contact with the gate insulation film and having a thickness larger than the gate insulation film; a gate electrode covering the gate insulation film in the trench and extending onto the thick insulation film; and a body layer formed in the semiconductor layer along the trench so as to be in contact with the gate insulation film. - View Dependent Claims (7, 8, 9)
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10. A trench gate type transistor comprising:
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a semiconductor layer comprising a plurality of trenches formed therein; a gate insulation film formed in the trenches; a thick insulation film disposed in end portions of the trenches so as to be in contact with the gate insulation film and having a thickness larger than the gate insulation film; a plurality of gate electrodes, each of the gate electrodes covering the gate insulation film in a corresponding trench and extending onto the thick insulation film; and a plurality of body layers formed in the semiconductor layer along the trenches so as to be in contact with the gate insulation film, wherein the gate electrodes are physically separated from each other. - View Dependent Claims (11)
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12. A method of manufacturing a trench gate type transistor, comprising:
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forming a trench having short sides and long sides in a surface portion of a semiconductor layer; implanting impurities into a sidewall and a bottom surface of the trench and into a front surface of a semiconductor substrate near the trench by obliquely ion-implanting the impurities in a direction of the long sides; implanting impurities into an upper portion of the sidewall of the trench and the front surface of the semiconductor substrate near the trench by obliquely ion-implanting the impurities in a direction of the short sides; forming a thick gate insulation film by an accelerated oxidation in portions where the impurities are implanted; and forming a gate electrode so as to occupy the trench and cover the thick gate insulation film outside the trench. - View Dependent Claims (13)
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Specification