MIRROR REFLECTION PROCESSING METHOD FOR POSITION SENSITIVE DETECTOR DEVICE

• US 20100108892A1
• Filed: 11/04/2009
• Published: 05/06/2010
• Est. Priority Date: 11/05/2008
• Status: Active Grant

• Current Assignee: Shanghai Kohler Electronics Ltd.
• Original Assignee: Shanghai Kohler Electronics Ltd.
• Inventors: ZHANG, Jian, CHEN, Guofeng, LIU, Xingyan
• Granted Patent: US 8,552,384 B2
• Time in Patent Office: Days
• US Class Current: 250/353
• CPC Class Codes: G01J 5/0806 Focusing or collimating elements, e.g. lenses or concave mirrors
• CPC Class Codes: G01S 17/48 Active triangulation systems, i.e. using the transmission and reflection of electromagnetic waves other than radio waves
• CPC Class Codes: G01S 7/491 Details of non-pulse systems

Abstract

A mirror reflection processing method for a position sensitive detector device in intelligent bathroom products. The infrared emitter in the position sensitive detector device is provided with two infrared emitting intensity modes. The position sensitive detector device determines whether to consider that no signal is collected in current collection according to the result of comparison between the reflected infrared signal intensity received by the infrared receiver and the preset value therein, thereby overcoming the mis-operation of the position sensitive detector device when being opposite to objects with relatively high reflectivity, and making the position sensitive detector device even more widely applied.

Claims

1. A minor reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein the infrared emitter has four infrared emitting intensity modes sequentially switchable which are first, second, third and fourth infrared emitting intensity modes in a descending order of intensity, and the mirror reflection processing method is provided with a minor interference determination procedure, comprising:

calculating a voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver, wherein the voltage value in the fourth infrared emitting intensity mode is calculated; and

setting a first fixed value and comparing the voltage value calculated in the fourth infrared emitting intensity mode with the first fixed value, and determining that the reflected infrared rays are caused by a mirror interference when the voltage value is greater than the first fixed value;

wherein the mirror reflection processing method is provided with a mirror interference processing procedure, comprising considering that no signal is collected by the position sensitive detector device when determining the minor interference.

2. The mirror reflection processing method for the position sensitive detector device according to claim 1, wherein, in the mirror interference determining procedure, there are two voltage values which are calculated from the infrared signals received by the infrared receiver and one of the two voltage values is designated as a designated voltage value for determining.

3. The mirror reflection processing method for the position sensitive detector device according to claim 2, wherein the minor interference determining procedure comprises:

calculating, in the fourth infrared emitting intensity mode with the lowest intensity, the two voltage values according to the infrared signals received;

setting a second fixed value and a first set range so as to determine that the reflected infrared rays are caused by the mirror interference when the difference between the two voltage values is below the second fixed value and the designated voltage value falls within the first set range.

4. The mirror reflection processing method for the position sensitive detector device according to claim 2, wherein the mirror interference determining procedure comprises:

setting a second set range so as to determine that the reflected infrared rays are caused by the mirror interference in the third emitting intensity modes if the designated voltage value which is output according to the received infrared signals exceeds the second set range.

5. The mirror reflection processing method for the position sensitive detector device according to claim 2, wherein the mirror interference determining procedure comprises:

setting a lowest threshold so as to determine that the reflected infrared rays are caused by the mirror interference in any of the infrared emitting intensity modes if the designated voltage value which is output according to the received infrared signals is below the lowest threshold.

6. The mirror reflection processing method for the position sensitive detector device according to claim 2, wherein in the mirror interference determining procedure, the determining comprises performing a processing of delaying or performing a processing of increasing the number of determinations.

7. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein:

the infrared emitter is provided with at least two infrared emitting intensity modes sequentially switchable; and

the mirror reflection processing method is provided with a mirror interference determination procedure, comprising;

calculating a voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver, wherein the voltage value in the infrared emitting intensity mode with the lowest intensity is calculated; and

setting a first fixed value and comparing the voltage value with the first fixed value, and determining that the reflected infrared rays are caused by a mirror interference when the voltage value is greater than the first fixed value;

wherein the mirror reflection processing method is provided with a mirror interference processing procedure, comprising considering that no signal is collected by the position sensitive detector device when determining the mirror interference.

8. The mirror reflection processing method for the position sensitive detector device according to claim 7, wherein:

in the mirror interference determining procedure, there are two voltage values which are calculated from the infrared signals received by the infrared receiver and one of the two voltage values is designated as a designated voltage value for determining.

9. The mirror reflection processing method for the position sensitive detector device according to claim 7, wherein, in the mirror interference determining procedure, the determining comprises performing a processing of delaying or performing a processing of increasing the number of determinations.

10. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein:

the infrared emitter is provided with at least two infrared emitting intensity modes sequentially switchable; and

the mirror reflection processing method is provided with a mirror interference determination procedure, comprising;

calculating a voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver, wherein two voltage values in the infrared emitting intensity mode with relatively lower intensity are calculated; and

setting a second fixed value and a first set range and comparing a difference between the two voltage values with the second fixed value and determining that the reflected infrared rays are caused by a mirror interference when the difference is below the second fixed value and the voltage value falls within the voltage range;

wherein the mirror reflection processing method is provided with a mirror interference processing procedure, comprising considering that no signal is collected by the position sensitive detector device when determining the mirror interference.

11. The mirror reflection processing method for the position sensitive detector device according to claim 10, wherein:

in the mirror interference determining procedure, there are two voltage values which are calculated from the infrared signals received by the infrared receiver and one of the two voltage values is designated as a designated voltage value for determining.

12. The mirror reflection processing method for the position sensitive detector device according to claim 10, wherein, in the mirror interference determining procedure, the determining comprises performing a processing of delaying or performing a processing of increasing the number of determinations.

13. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein:

the infrared emitter is provided with at least two infrared emitting intensity modes sequentially switchable; and

the mirror reflection processing method is provided with a mirror interference determination procedure, comprising;

calculating a voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver; and

setting a lowest threshold and comparing the voltage value with the first lowest threshold, and determining that the reflected infrared rays are caused by a mirror interference when the voltage value is lower than the lowest threshold;

wherein the mirror reflection processing method is provided with a mirror interference processing procedure, comprising considering that no signal is collected by the position sensitive detector device when determining the mirror interference.

14. The mirror reflection processing method for the position sensitive detector device according to claim 13, wherein in the mirror interference determining procedure, there are two voltage values which are calculated from the infrared signals received by the infrared receiver and one of the two voltage values is designated as a designated voltage value for determining.

15. The mirror reflection processing method for the position sensitive detector device according to claim 13, wherein in the mirror interference determining procedure, the determining comprises performing a processing of delaying or performing a processing of increasing the number of determinations.

16. A mirror reflection processing method for a position sensitive detector device, wherein the position sensitive detector device comprises an infrared emitter for emitting infrared rays and an infrared receiver for receiving reflected infrared rays, wherein the mirror reflection processing method is provided with a mirror interference determination procedure and a mirror interference processing procedure,

wherein the mirror interference determination procedure comprises:

calculating a voltage value according to infrared signals received by the infrared receiver so as to indicate an infrared signal intensity of the infrared rays received by the infrared receiver; and

comparing the calculated voltage value with a preset fixed value or range to judge whether the reflected infrared rays are caused by a mirror interference;

the mirror interference processing procedure comprises considering that no signal is collected by the position sensitive detector device when determining the mirror interference.