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PRINTING OF REDISTRIBUTION TRACES ON ELECTRONIC COMPONENT

  • US 20100109688A1
  • Filed: 11/04/2008
  • Published: 05/06/2010
  • Est. Priority Date: 11/04/2008
  • Status: Active Grant
First Claim
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1. :

  • A probe substrate for use in testing semiconductor devices comprising;

    a base substrate comprising first electrical terminals at a first pitch; and

    one or more redistribution layers comprising a plurality of droplets of a conductive material forming a plurality of redistribution traces extending from the first terminals to second electrical terminals at a second pitch different from the first pitch.

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