APPARATUS, SYSTEM AND METHOD FOR TESTING ELECTRONIC ELEMENTS
First Claim
1. An electronic element testing apparatus for use with a number of probes, each probe having a lower pole and an upper pole, the apparatus comprising:
- a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and
a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit,wherein when lower poles are disposed at at least some of the lower pole regions, when each lower pole contacts a first terminal region of an electronic element, when an upper pole complementary to each lower pole contacts a second terminal region of the electronic element, and when each signal conductor region provides a non-cable electrical path between a lower pole region and a switching circuit, the switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
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Accused Products
Abstract
An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
20 Citations
6 Claims
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1. An electronic element testing apparatus for use with a number of probes, each probe having a lower pole and an upper pole, the apparatus comprising:
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a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit, wherein when lower poles are disposed at at least some of the lower pole regions, when each lower pole contacts a first terminal region of an electronic element, when an upper pole complementary to each lower pole contacts a second terminal region of the electronic element, and when each signal conductor region provides a non-cable electrical path between a lower pole region and a switching circuit, the switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification