UNIVERSAL CURRENT LEAKAGE TESTING ADAPTER

• US 20100109694A1
• Filed: 10/31/2008
• Published: 05/06/2010
• Est. Priority Date: 10/31/2008
• Status: Active Grant

• Current Assignee: General Electric Company
• Original Assignee: Sonora Medical Systems, Inc.
• Inventors: Ginther, James, Dananay, Steven Emil, Moore, G. Wayne
• Granted Patent: US 7,880,488 B2
• Time in Patent Office: Days
• US Class Current: 324/756.50
• CPC Class Codes: G01R 31/52 Testing for short-circuits, leakage current or ground faults
• CPC Class Codes: H01R 13/7036 the switch being in series with coupling part, e.g. dead coupling, explosion proof coupling
• CPC Class Codes: H01R 2201/20 for testing or measuring purposes
• CPC Class Codes: H01R 27/00 Coupling parts adapted for co-operation with two or more dissimilar counterparts for dissimilar contact members H01R13/35; supported only by co-operation with a counterpart H01R31/00; with a holder adapted for supporting apparatus to which its counterpart is attached H01R33/90

Abstract

In one embodiment, a universal current leakage measurement device is disclosed. A universal current leakage testing adapter has the ability to couple with at least two differently sized or shaped probe connectors. The universal current leakage testing adapter is configured to couple with differently sized or shaped probe connectors by conductive planes either functioning independently or in concert to contact the pins of a probe connector.

Claims

1. A device for applying current to at least a first probe connector and a second probe connector, wherein the first probe connector and the second probe connector are different sizes, the device comprising:

a housing;

a first conductive stage coupled with the housing, the first conductive stage being configured to contact a plurality of pins of the first probe connector when the first probe connector is coupled with the device; and

a second conductive stage coupled with the housing, the second conductive stage being configured to contact a plurality of pins of the second probe connector when the second probe connector is coupled to the device,

wherein a contact surface of the first conductive stage functions in concert with a contact surface of the second conductive stage to contact a plurality of pins of the second probe connector when the second probe connector is coupled to the device.

2. The device of claim 1, wherein the second conductive stage at least partially frames the first conductive stage, allowing the first conductive stage to telescope through the second conductive stage, resulting in the contact surface of the first conductive stage being substantially planar with the contact surface of the second conductive stage when the second probe connector is coupled to the device.

3. The device of claim 1, wherein the first conductive stage comprises a pass-through for a center locking pin of a probe connector.

4. The device of claim 1, further comprising a gripping mechanism coupled with the housing, the gripping mechanism being configured to grip a center locking pin of a probe connector.

5. The device of claim 1, further comprising a third conductive stage coupled with the housing, the third conductive stage contacting a plurality of pins of a third probe connector, when the third probe connector is coupled to the device,

wherein the contact surface of the first conductive stage and the contact surface of the second conductive stage function in concert with a contact surface of the third conductive stage to contact a plurality of pins of the third probe connector when the third probe connector is coupled to the device.

6. The device of claim 5, wherein the third conductive stage at least partially frames the first and second conductive stages, allowing the first and second conductive stages to telescope through the third conductive stage, resulting in the contact surfaces of the first and second conductive stages being substantially planar with a contact surface of the third conductive stage, when the third probe connector is coupled to the device.

7. The device of claim 1, further comprising at least a first electrical source connector electrically coupled with at least the contact surface of the first conductive stage.

8. The device of claim 1, further comprising a micro switch to electrically couple and electrically decouple at least the first conductive stage to and from an electrical source connector.

9. A device for applying current to probes of different sizes, the device comprising:

a housing;

a first conductive stage coupled with the housing having a first exposed surface corresponding to a first size probe connector; and

a second conductive stage coupled with the housing having a second exposed surface corresponding to a second size probe connector;

wherein in a first configuration, the first exposed surface contacts a plurality of pins of the first size probe connector, and

wherein in a second configuration, the first exposed surface and the second exposed surface contact a plurality of pins of the second size probe connector.

10. The device of claim 9, wherein the second configuration further comprises the first conductive stage depressing through the second conductive stage and the first exposed surface being substantially planar with the second exposed surface.

11. The device of claim 9, further comprising:

a third conductive stage coupled with the housing, having a third exposed surface corresponding to a third size probe connector;

wherein in a third configuration, the first exposed surface, the second exposed surface, and the third exposed surface contact a plurality of pins of the third size probe connector.

12. The device of claim 9, wherein the first exposed surface comprises a pass-through for a center locking pin.

13. The device of claim 9, further comprising a gripping device to couple with a center locking pin of a probe connector.

14. The device of claim 9, further comprising a switch to electrically couple and electrically decouple each conductive surface to and from an electrical source connector when a conductive surface is depressed.

15. A device for applying current to probe connectors of varying sizes, comprising:

first means for contacting a first plurality of pins of a first probe with a first connector size; and

second means for contacting a second plurality of pins of a second probe with a second connector size, wherein the second means incorporates the first means

16. The device of claim 15, further comprising a means for applying voltage to a probe connector through at least the first means.

17. The device of claim 15, further comprising a gripping means for gripping a center locking pin.

18. The device of claim 15, further comprising a means for electrically connecting a plurality of pins on a probe connector to electrical ground.

19. The device of claim 15, further comprising a third means for contacting a plurality of pins on a third probe with a third connector size, wherein the third means incorporates the first and second means.

20. The device of claim 15, further comprising a means for electrically connecting each means that is in contact with pins on a probe connector to a means for supplying current.