Test chip, detection apparatus, and method for detecting analyte

• US 20100112578A1
• Filed: 10/29/2009
• Published: 05/06/2010
• Est. Priority Date: 10/31/2008
• Status: Abandoned Application

• Current Assignee: Sysmex Corporation
• Original Assignee: Sysmex Corporation
• Inventors: Kirimura, Hiroya, Iwanaga, Shigeki
• Application Number:
  US12/589,903
• Publication Number:
  US 20100112578A1
• Time in Patent Office: Days
• US Class Current: 435/6
• CPC Class Codes: G01N 27/305 optically transparent or photoresponsive electrodes
• CPC Class Codes: G01N 27/3277 being a redox reaction, e.g. detection by cyclic voltammetry voltammetry per se G01N27/42, G01N27/48
• CPC Class Codes: G01N 33/5438 Electrodes

Abstract

A test chip for detecting an analyte modified with a modulator releasing electrons upon photoexcitation, comprising: semiconductor electrode part including a metal layer formed on a semiconductor layer; a probe immobilized on the metal layer, the probe trapping the analyte; and a counter electrode part including a conductive layer. A detection apparatus and a method for detecting an analyte are also disclosed.

Claims

1. A test chip for detecting an analyte modified with a modulator releasing electrons upon photoexcitation, comprising:

a semiconductor electrode part including a metal layer formed on a semiconductor layer;

a probe immobilized on the metal layer, the probe trapping the analyte; and

a counter electrode part including a conductive layer.

2. The test chip of claim 1, wherein the metal layer is dissolved with an electrolyte.

3. The test chip of claim 2, wherein the electrolyte comprises iodine or an iodide.

4. The test chip of claim 1, wherein the metal layer comprises a metal chemically adsorbed onto the probe.

5. The test chip of claim 4, wherein the metal chemically adsorbed onto the probe is gold.

6. The test chip of claim 1, wherein the probe has a thiol group as a bonding group for being chemically adsorbed onto the metal layer.

7. The test chip of claim 1, wherein the metal layer is formed on the semiconductor layer by deposition or sputtering.

8. The test chip of claim 1, wherein the probe is a nucleic acid.

9. An apparatus for detecting an analyte modified with a modulator releasing electrons upon photoexcitation, comprising:

a test chip receiving part capable of receiving a test chip;

a light source for irradiating a modulator with light to photoexcite the modulator modifying the analyte; and

an electric current measuring part for measuring an electric current flowing generated from the photoexcited modulator modifying the analyte;

wherein the test chip comprises;

a semiconductor electrode part including a metal layer formed on a semiconductor layer;

a probe immobilized on a metal layer, the probe trapping an analyte; and

a counter electrode part including a conductor layer.

10. The detection apparatus of claim 9, wherein the light source generates a light having wavelength that excites the modulator with which an analyte is modified.

11. The detection apparatus of claim 9, wherein the probe is a nucleic acid.

12. The detection apparatus of claim 9, wherein the probe is immobilized by chemically adsorbing the metal layer.

13. The detection apparatus of claim 9, wherein the probe has a thiol group as a bonding group for being chemically adsorbed onto the metal layer.

14. A method for detecting an analyte modified with a modulator releasing electrons upon photoexcitation, comprising:

trapping an analyte in a sample by using a test chip;

irradiating the modulator with light to photoexcite the modulator modifying the analyte; and

detecting an electric current flowing generated from the photoexcited modulator;

wherein the test chip comprises;

a semiconductor electrode part including a metal layer formed on a semiconductor layer;

a probe immobilized on the metal layer, the probe trapping an analyte; and

a counter electrode part of a conductive layer;

modifying the analyte with a modulator.

15. The method of claim 14, further comprising adding an electrolyte medium for passing an electric current between the semiconductor electrode part and the counter electrode part.

16. The method of claim 15, wherein the electrolyte medium comprises an electrolyte and an organic solvent which dissolve the metal layer.

17. The method of claim 16, wherein the electrolyte comprises iodine or an iodide.

18. The method of claim 14, wherein the probe is a nucleic acid.

19. The method of claim 14, wherein the probe is immobilized by chemically adsorbing the metal layer.

20. The method of claim 14, wherein the probe has a thiol group as a bonding group for being chemically adsorbed onto the metal layer.