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AUTOMATIC DEFECT MANAGEMENT IN MEMORY DEVICES

  • US 20100115376A1
  • Filed: 12/03/2007
  • Published: 05/06/2010
  • Est. Priority Date: 12/03/2006
  • Status: Active Grant
First Claim
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1. A method for storing data in a memory that includes analog memory cells, comprising:

  • identifying one or more defective memory cells in a group of the analog memory cells;

    selecting an Error Correction Code (ECC) responsively to a characteristic of the identified defective memory cells; and

    encoding the data using the selected ECC and storing the encoded data in the group of the analog memory cells.

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