Systems and Methods for Controlling Ion Deposition
First Claim
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1. A method of depositing ions in water, comprising:
- determining a conductivity level of the water using a reference probe;
determining a power level based on the determined conductivity level;
applying power to a deposition probe corresponding to the determined power level using a first electrical circuit; and
depositing a concentration of ions in the water.
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Abstract
The present disclosure generally provides systems and methods of controlling an ion concentration in water, for example, a silver ion concentration. The method of depositing ions in the water includes determining a conductivity level of the water using a reference probe. A power level based on the determined conductivity level is also determined. Power is applied to a deposition probe corresponding to the determined power level using a first electrical circuit, and a concentration of ions are deposited in the water.
19 Citations
19 Claims
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1. A method of depositing ions in water, comprising:
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determining a conductivity level of the water using a reference probe; determining a power level based on the determined conductivity level; applying power to a deposition probe corresponding to the determined power level using a first electrical circuit; and depositing a concentration of ions in the water. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system for depositing ions in water, comprising:
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a reference probe coupled to an electrical circuit; a deposition probe coupled to the electrical circuit; and wherein the electrical circuit comprises a power source, the electrical circuit being operable to; determine a conductivity level of the water using the reference probe; determine a power level to deliver to the deposition probe based on the determined conductivity level; and supply the determined power level to the deposition probe, the power and the water ionizing a material on the deposition probe. - View Dependent Claims (11, 12, 13, 14)
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15. A method of determining wear of a deposition probe, comprising:
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determining a deposition probe resistance based on a deposition probe feedback voltage and a deposition probe feedback current to an electrical circuit; determining if the deposition probe resistance is less than a first predetermined value; and indicating that the deposition probe has not worn past a first length when the deposition probe resistance is less than the first predetermined value. - View Dependent Claims (16, 17, 18, 19)
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Specification