SYSTEMS AND METHODS FOR CHARGED DEVICE MODEL ELECTROSTATIC DISCHARGE TESTING

• US 20100117674A1
• Filed: 05/13/2009
• Published: 05/13/2010
• Est. Priority Date: 11/11/2008
• Status: Abandoned Application

• Current Assignee: Thermo Fisher Scientific Incorporated
• Original Assignee: Thermo Fisher Scientific Incorporated
• Inventors: Hernandez, Marcos
• Application Number:
  US12/465,099
• Publication Number:
  US 20100117674A1
• Time in Patent Office: Days
• US Class Current: 324/754.220
• CPC Class Codes: G01R 31/002 where the device under test is an electronic circuit

Abstract

Systems and methods for testing an integrated circuit device using transmission path and charged device model electrostatic discharge testing. The method includes measuring a electrostatic discharge signal from a charged transmission path of the system, measuring a electrostatic discharge signal from the charged transmission path of the system and a charged integrated circuit device coupled with the charged transmission path, and determining a charged device model waveform based upon distinctions between these electrostatic discharge signals.

Claims

1. A method of testing an integrated circuit device, the method comprising:

measuring a first electrostatic discharge signal from a charged transmission path;

measuring a second electrostatic discharge signal from the charged transmission path and a charged integrated circuit device coupled with the charged transmission path; and

determining a charged device model (CDM) waveform based upon the first and second electrostatic discharge signals.

2. The method of claim 1 wherein the first electrostatic discharge signal is contained in a first waveform, the second electrostatic discharge signal is contained in a second waveform, and determining the CDM waveform comprises:

removing the first waveform from the second waveform to yield the CDM waveform.

3. The method of claim 2 wherein removing the first waveform from the second waveform comprises:

subtracting the first waveform from the second waveform at corresponding times relative to a initial time for each respective measurement to yield the CDM waveform.

4. The method of claim 1 wherein measuring the first electrostatic discharge signal comprises:

charging the transmission path;

discharging the transmission path; and

in response to discharging the transmission path, measuring the first electrostatic discharge signal.

5. The method of claim 4 wherein measuring the second electrostatic discharge signal comprises:

electrically coupling the integrated circuit device with the transmission path;

concurrently charging the transmission path and the integrated circuit device;

concurrently discharging the transmission path and the integrated circuit device; and

in response to discharging the transmission path and the integrated circuit device, measuring the second electrostatic discharge signal;

.

6. The method of claim 4 wherein the transmission path is charged for a time greater than 50 milliseconds, and the transmission path and the integrated circuit device are charged for a time greater than 50 milliseconds.

7. The method of claim 1 wherein measuring the second electrostatic discharge signal comprises:

electrically coupling the integrated circuit device with the transmission path;

concurrently charging the transmission path and the integrated circuit device;

concurrently discharging the transmission path and the integrated circuit device; and

in response to discharging the transmission path and the integrated circuit device, measuring the second electrostatic discharge signal;

8. The method of claim 1 wherein measuring the first electrostatic discharge signal further comprises:

directing the first electrostatic discharge signal through at least one attenuator to an oscilloscope capable of determining the CDM waveform or to a controller capable of determining the CDM waveform.

9. The method of claim 8 wherein measuring the second electrostatic discharge signal further comprises:

directing the second electrostatic discharge signal through at least one attenuator to the oscilloscope or to the controller.

10. A system to test an integrated circuit device, the system comprising:

a first electrically conductive plate in electrical communication with electrical ground and configured to support the integrated circuit device;

a second electrically conductive plate in electrical communication with the electrical ground;

a probe pin in electrical communication with a transmission path to electrically communicate with the integrated circuit device;

a support arm operable to electrically couple the probe pin to the integrated circuit device and to support the second electrically conductive plate and the probe pin; and

a controller coupled with the probe pin and support arm, the controller configured to charge the transmission path of the system, discharge the transmission path, and measure a first electrostatic discharge signal, to move the support arm to electrically couple the integrated circuit device with the transmission path, charge the transmission path and the integrated circuit device, discharge the transmission path and the integrated circuit device, and measure a second electrostatic discharge signal from which the first electrostatic discharge signal can be removed to determine a charged device model (CDM) waveform.

11. The system of claim 10 wherein the second electrically conductive plate is a solid plate, and the probe pin projects a location peripherally inside the solid plate toward the first electrically conductive plate.

12. The system of claim 10 wherein the first electrically conductive plate is a wire screen having a plurality of substantially parallel wires along two intersecting directions to define a plurality of apertures, and the probe pin projects from the wire screen toward the first electrically conductive plate.

13. The system of claim 10 further comprising:

a high voltage power supply unit; and

a switch configured to selectively couple the high voltage power supply unit with the transmission line, the switch having a first position for electrically connecting the transmission path with the high voltage power supply unit to charge the transmission path and a second position in which the transmission line is disconnected from the high voltage power supply unit to discharge the transmission path for measuring the first and second electrostatic discharge signals.

14. The system of claim 13 wherein the impedance of the switch is approximately equal to the impedance of the transmission path.

15. The system of claim 13 further comprising:

an oscilloscope coupled by the switch in the second position to define a signal line with the transmission path, the device configured to determine the waveform by removing the first electrostatic discharge signal from the second electrostatic discharge signal.

16. The system of claim 15 further comprising:

at least one attenuator in the signal line between the oscilloscope and the switch.

17. The system of claim 16 wherein the at least one attenuator is configured to cause a 40dB attenuation of the first and second electrostatic discharge signals to the oscilloscope.

18. The system of claim 13 wherein the controller is coupled by the switch in the second position with the transmission path, the device configured to determine the waveform by removing the first electrostatic discharge signal from the second electrostatic discharge signal.

19. The system of claim 18 further comprising:

at least one attenuator in the signal line between the oscilloscope and the switch; and

a resistor in the signal line between the at least one attenuator and the controller.

20. The system of claim 10 wherein the transmission path is a coaxial cable including a core and a shield surrounding the core, the shield of the coaxial cable connected in electrical communication with electrical ground, and the first electrically conductive plate in electrical communication with the shield.