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COMPACT TEST CIRCUIT AND INTEGRATED CIRCUIT HAVING THE SAME

  • US 20100125431A1
  • Filed: 04/22/2009
  • Published: 05/20/2010
  • Est. Priority Date: 11/17/2008
  • Status: Abandoned Application
First Claim
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1. A test circuit, comprising:

  • a test mode item signal generating block configured to generate a plurality of test mode item signals corresponding to test mode items; and

    a coding block configured to code each of the test mode item signals to generate a multiplicity of test control signals.

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