TRANSPARENT ELECTRODE

• US 20100127611A1
• Filed: 05/20/2008
• Published: 05/27/2010
• Est. Priority Date: 05/22/2007
• Status: Abandoned Application

• Current Assignee: Nippon Electric Glass Company Limited
• Original Assignee: Nippon Electric Glass Company Limited
• Inventors: Kanai, Toshimasa, Kubosaka, Mamoru, Imura, Masaaki
• Application Number:
  US12/451,640
• Publication Number:
  US 20100127611A1
• Time in Patent Office: Days
• US Class Current: 313/326
• CPC Class Codes: C23C 14/08 Oxides C23C14/10 takes precedence
• CPC Class Codes: C23C 14/086 of zinc, germanium, cadmium, indium, tin, thallium or bismuth
• CPC Class Codes: G02B 1/115 Multilayers
• CPC Class Codes: G02F 1/13439 characterised by their electrical, optical, physical properties; materials therefor; method of making
• CPC Class Codes: G02F 2201/083 infrared absorbing
• CPC Class Codes: G02F 2201/307 Reflective grating, i.e. Bragg grating
• CPC Class Codes: G02F 2201/38 Anti-reflection arrangements
• CPC Class Codes: G02F 2203/11 involving infrared radiation

Abstract

To provide a transparent electrode having high infrared light transmittance that is used in an optical communication device using infrared light, particularly infrared light near 1.55 μm, the transparent electrode of the present invention includes a transparent conductive film, and the extinction coefficient of the transparent conductive film at a wavelength of 1.55 μm is equal to or less than 0.5.

Claims

1. A transparent electrode comprising a transparent conductive film, wherein the extinction coefficient of the transparent conductive film at a wavelength of 1.55 μ

m is equal to or less than 0.5.

2. The transparent electrode of claim 1, wherein the transparent conductive film is deposited by a sputtering process in an atmosphere satisfying the condition that the ratio of the flow rate of O₂ gas to the flow rate of rare gas is equal to or greater than 3.0×

10<sup>−

3</sup>.

3. The transparent electrode of claim 1, wherein the extinction coefficient of the transparent conductive film at a wavelength of 1.55 μ

m is equal to or less than 0.01.

4. The transparent electrode of claim 3, wherein the transparent conductive film is deposited by a sputtering process in an atmosphere satisfying the condition that the ratio of the flow rate of O₂ gas to the flow rate of rare gas is equal to or greater than 5.0×

10<sup>−

3</sup>.

5. The transparent electrode of claim 1, wherein the transparent conductive film is made of indium tin oxide.

6. The transparent electrode of claim claim 1, wherein the transparent conductive film is made of indium tin oxide and deposited by a sputtering process in an atmosphere satisfying the condition that the ratio of the flow rate of O₂ gas to the flow rate of rare gas is equal to or greater than 4.0×

10<sup>−

3</sup>.

7. The transparent electrode of claim 1, wherein the transparent conductive film is made of indium titanium oxide.

8. The transparent electrode of claim 7, wherein the transparent electrode is deposited by a sputtering process in an atmosphere satisfying the condition that the ratio of the flow rate of O₂ gas to the flow rate of rare gas is equal to or greater than 10.0×

10<sup>−

3</sup>.

9. The transparent electrode of claim 1, wherein the geometric thickness of the transparent conductive film is 5 to 200 nm.

10. The transparent electrode of claim 1, wherein the sheet resistance of the transparent conductive film is 500 ohm/sq. or more.

11. The transparent electrode of claim 1, wherein the transparent conductive film is formed on a substrate.

12. The transparent electrode of claim 1, further comprising an antireflection film.

13. The transparent electrode of claim 12, wherein the antireflection films are formed on both the front and back sides of the substrate.

14. The transparent electrode of claim claim 12, wherein the transparent conductive film is formed on the antireflection film formed on the front side of the substrate.

15. The transparent electrode of claim 12, wherein the antireflection film is a stacked film composed of a low-refractive index layer and a high-refractive index layer.

16. The transparent electrode of claim 1, used in an optical communication device using infrared light.

17. The transparent electrode of claim 16, wherein the optical communication device using infrared light is a tunable filter or a tunable laser.

18. A method for producing a transparent conductive film, the method comprising depositing a transparent conductive film by use of a sputtering process in a sputtering atmosphere satisfying the condition that the ratio of the flow rate of O₂ gas to the flow rate of rare gas is equal to or greater than 3.0×

10<sup>−

3</sup>.

19. The method for producing a transparent conductive film of claim 18, wherein the sputtering atmosphere satisfies the condition that the ratio of the flow rate of O₂ gas to the flow rate of rare gas is equal to or greater than 5.0×

10<sup>−

3</sup>.