FIXING APPARATUS FOR A PROBE CARD

• US 20100127726A1
• Filed: 05/22/2008
• Published: 05/27/2010
• Est. Priority Date: 05/31/2007
• Status: Active Grant

• Current Assignee: Advantest Corporation
• Original Assignee: Advantest Corporation
• Inventors: Matsumura, Shigeru, Abe, Yoshihiro
• Granted Patent: US 8,212,579 B2
• Time in Patent Office: Days
• US Class Current: 324/756.30
• CPC Class Codes: G01R 31/2889 Interfaces, e.g. between probe and tester G01R31/31905 and G01R1/07364 take precedence
• CPC Class Codes: G01R 31/31905 Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

Abstract

A fixing apparatus for fixing a probe card to a holder includes a screw fixed to the holder and binding the probe card onto the holder in a vertical direction, a first bearing member intervening between a head of the screw and the probe card and allowing expansion and contraction of the probe card with respect to the screw in a horizontal direction, and a second bearing member intervening between the probe card and the holder and allowing expansion and contraction of the probe card with respect to the holder in the horizontal direction.

Claims

1. A fixing apparatus for fixing a probe card to a holder a, wherein

the probe card is provided stretchably with respect to the holder in a direction substantially parallel to a main surface of the probe card, and the probe card is bound onto the holder in a direction substantially perpendicular to the main surface of the probe card.

2. The fixing apparatus as recited in claim 1, comprising:

a binding device configured to bind the probe card onto the holder in the direction substantially perpendicular to the main surface of the probe card; and

an allowing device configured to allow expansion and contraction of the probe card with respect to the holder in the direction substantially parallel to the main surface of the probe card.

3. The fixing apparatus as recited in claim 2, wherein

the binding device is fixed to the holder, and the allowing device includes:

a first bearing member intervening between the binding device and the probe card and allowing expansion and contraction of the probe card with respect to the binding device in the parallel direction; and

a second bearing member intervening between the probe card and the holder and allowing expansion and contraction of the probe card with respect to the holder in the parallel direction.

4. The fixing apparatus as recited in claim 3, wherein the binding device includes a screw member being fixed to the holder via a through-hole formed on a stiffener of the probe card.

5. The fixing apparatus as recited in claim 2, wherein

the binding device is fixed to the probe card, and

the allowing device includes:

a first bearing member intervening between the binding device and the holder and allowing a small movement of the binding device with respect to the holder in the parallel direction; and

a second bearing member intervening between the holder and the probe card and allowing expansion and contraction of the probe card with respect to the holder in the parallel direction.

6. The fixing apparatus as recited in claim 5, wherein the binding device includes a screw member being fixed to a stiffener of the probe card via a through-hole formed on the holder.

7. The fixing apparatus as recited in claim 1, comprising:

a guiding member provided on one of the probe card or the holder along the direction substantially parallel to the main surface of the probe card; and

a sliding member provided on another of the holder or the probe card, engaged with the guiding member in the direction perpendicular to the main surface of the probe card and being able to slide on the guiding member.

8. A testing apparatus for an electronic device, comprising:

a testing apparatus main frame for testing a device under test formed on a semiconductor wafer;

a probe card for establishing an electrical connection between the device under test and the testing apparatus main frame;

a prober for pressing the probe card onto the semiconductor wafer; and

a holder for fixing the probe card to the prober, wherein

the probe card is fixed to the holder by using the fixing apparatuses as recited in claim 1.