METHODS AND SYSTEMS FOR AUTOMATED DATA MAPPING AND ANALYSIS

• US 20100131522A1
• Filed: 11/24/2008
• Published: 05/27/2010
• Est. Priority Date: 11/24/2008
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Dam, Hien Duy
• Granted Patent: US 8,117,218 B2
• Time in Patent Office: Days
• US Class Current: 707/756
• CPC Class Codes: G06Q 50/04 Manufacturing
• CPC Class Codes: Y02P 90/30 Computing systems specially adapted for manufacturing

Abstract

A method for automated data mapping and analysis is described. The method includes receiving test data from a plurality of test objects at a data storage facility, selecting a test environment and analysis parameters from a user interface, retrieving a portion of the test data from the data storage facility based on the selected test environment and analysis parameters, ensuring the retrieved test data is in a common format, and analyzing the retrieved test data to generate at least one of a trending profile, an overlay profile, and a maintenance profile for the test objects for the selected analysis parameter.

Claims

1. An automated data mapping and analysis method comprising:

receiving test data from a plurality of test objects at a data storage facility;

selecting a test environment and analysis parameters from a user interface;

retrieving a portion of the test data from the data storage facility based on the selected test environment and analysis parameters;

ensuring the retrieved test data is in a common format; and

analyzing the retrieved test data to generate at least one of a trending profile, an overlay profile, and a maintenance profile for the test objects for the selected analysis parameter.

2. A method according to claim 1 wherein the test data includes at least one of manufacturing test data and operational data for an object under test.

3. A method according to claim 1 wherein receiving test data from a plurality of test objects at a data storage facility comprises receiving the test data via a network operationally connected to a data storage server.

4. A method according to claim 1 wherein selecting a test environment comprises:

determining if a test environment table is available;

loading and displaying an available test environment table; and

creating a test environment table if one is not available.

5. A method according to claim 1 wherein selecting a test environment comprises selecting at least one of an interface connectivity, object under test identifiers, model identifiers, test environment identifiers, a listing of object under test identifiers, and test characterization identifiers.

6. A method according to claim 1 wherein selecting analysis parameters comprises:

determining if an analysis parameters table is available;

loading and displaying an available analysis parameters table; and

creating an analysis parameters table if one is not available.

7. A method according to claim 1 wherein selecting analysis parameters comprises selecting at least one of a listing of the units for an object under test and test parameter identifiers.

8. A method according to claim 1 wherein analyzing the retrieved test data to generate a trending profile comprises comparing test result data from at least one previously tested object under test to that of a current object under test.

9. A method according to claim 1 wherein analyzing the retrieved test data to generate an overlay profile comprises displaying test result data from at least one previously tested object under test with respect to that of a current object under test.

10. A method according to claim 1 further comprising at least one of:

storing trending test parameters data in a trending profile workbook for all the object under test identifiers;

storing predictions regarding trending test parameters data for future objects under test; and

generating trending test summary reports for the objects under test.

11. A method for generating a trending profile for objects under test, said method comprising:

selecting and displaying object under test identifiers, test characterization identifiers, and trending test parameter identifiers;

determining if data associated with an object under test, identified by a counter setting is available on a server in a common data format;

extracting trending test parameters data for the object under test if the data is available on the server; and

incrementing the counter if the data is not available on the server.

12. A system for automated data mapping and analysis, said system comprising:

a computer comprising a user interface; and

a data storage facility communicatively coupled to said computer, said computer programmed to;

receive test data from a plurality of test objects;

store the test data within said data storage facility;

receive, via said user interface, a user selection of a test environment and analysis parameters;

retrieve a portion of the test data from said data storage facility, based on the selected test environment and analysis parameters; and

analyze the retrieved test data to generate at least one of a trending profile, an overlay profile, and a maintenance profile for the test objects based on the selected analysis parameters.

13. A system according to claim 12 wherein said computer is programmed to convert the retrieved test data into a common data format.

14. A system according to claim 12 wherein to retrieve a portion of the test data from said data storage facility, said computer is programmed to:

determine if a test environment table is available;

load and display an available test environment table; and

create a test environment table if one is not available.

15. A system according to claim 12 wherein to receive a user selection of a test environment, said computer is programmed to receive selections of at least one of an interface connectivity, object under test identifiers, model identifiers, test environment identifiers, a listing of object under test identifiers, and test characterization identifiers.

16. A system according to claim 12 wherein to retrieve a portion of the test data from said data storage facility, said computer is programmed to:

determine if an analysis parameters table is available;

load and display an available analysis parameters table; and

create an analysis parameters table if one is not available.

17. A system according to claim 12 wherein to receive a user selection of analysis parameters, said computer is programmed to receive selections of at least one of a listing of the units for an object under test and test parameter identifiers.

18. A system according to claim 12 wherein to analyze the retrieved test data to generate a trending profile, said computer is programmed to compare test result data from at least one previously tested object under test to that of a current object under test.

19. A system according to claim 12 wherein to analyze the retrieved test data to generate an overlay profile, said computer is programmed to display test result data from at least one previously tested object under test with respect to that of a current object under test.

20. A system according to claim 12 wherein said computer is programmed for at least one of:

storing trending test parameters data in a trending profile workbook in said data storage facility for all the object under test identifiers;

storing predictions in said data storage facility regarding trending test parameters data for future objects under test; and

generating trending test summary reports for the objects under test.