MODELING MASK CORNER ROUNDING EFFECTS USING MULTIPLE MASK LAYERS
First Claim
1. A computer-executed method for determining a process model which models mask corner rounding effects, the method comprising:
- receiving a mask layout;
receiving process data which was generated by applying a photolithography process to the mask layout;
receiving an uncalibrated process model which includes;
an optical component; and
a set of mask-corner-rounding (MCR) components, whereineach MCR component is designed to model MCR effects;
identifying a set of corners in the mask layout;
determining a set of mask layers which includes;
a first mask layer which includes substantially all patterns in the mask layout; and
a set of MCR mask layers, wherein substantially all patterns in each MCR mask layer relate to patterns in the mask layout that are in proximity to the set of corners, and wherein each MCR mask layer is associated with an MCR component; and
using one or more computers to calibrate the uncalibrated process model using the set of mask layers and the process data.
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Abstract
An embodiment provides systems and techniques for determining an improved process model which models mask corner rounding (MCR) effects. During operation, the system may receive a mask layout and process data which was generated by applying a photolithography process to the mask layout. The system may also receive an uncalibrated process model which may contain a set of MCR components. Next, the system may identify a set of corners in the mask layout. The system may then determine a set of mask layers, wherein at least some of the mask layers correspond to the MCR components. Next, the system may determine an improved process model by calibrating the uncalibrated process model using the set of mask layers, and the process data.
20 Citations
21 Claims
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1. A computer-executed method for determining a process model which models mask corner rounding effects, the method comprising:
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receiving a mask layout; receiving process data which was generated by applying a photolithography process to the mask layout; receiving an uncalibrated process model which includes; an optical component; and a set of mask-corner-rounding (MCR) components, wherein each MCR component is designed to model MCR effects; identifying a set of corners in the mask layout; determining a set of mask layers which includes; a first mask layer which includes substantially all patterns in the mask layout; and a set of MCR mask layers, wherein substantially all patterns in each MCR mask layer relate to patterns in the mask layout that are in proximity to the set of corners, and wherein each MCR mask layer is associated with an MCR component; and using one or more computers to calibrate the uncalibrated process model using the set of mask layers and the process data. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A computer-readable storage device storing instructions that when executed by a computer cause the computer to perform a method for determining a process model which models mask corner rounding effects, the method comprising:
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receiving a mask layout; receiving process data which was generated by applying a photolithography process to the mask layout; receiving an uncalibrated process model which includes; an optical component; and a set of mask-corner-rounding (MCR) components, wherein each MCR component is designed to model MCR effects; identifying a set of corners in the mask layout; determining a set of mask layers which includes; a first mask layer which includes substantially all patterns in the mask layout; and a set of MCR mask layers, wherein substantially all patterns in each MCR mask layer relate to patterns in the mask layout that are in proximity to the set of corners, and wherein each MCR mask layer is associated with an MCR component; and calibrating the uncalibrated process model using the set of mask layers and the process data. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. An apparatus for determining a process model which models mask corner rounding effects, comprising:
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a processor; and a memory storing instructions that when executed by the processor cause the system to determine a process model which models mask corner rounding effects, the instructions comprising; instructions for receiving a mask layout; instructions for receiving process data which was generated by applying a photolithography process to the mask layout; instructions for receiving an uncalibrated process model which includes; an optical component; and a set of mask-corner-rounding (MCR) components, wherein each MCR component is designed to model MCR effects; instructions for identifying a set of corners in the mask layout; instructions for determining a set of mask layers which includes; a first mask layer which includes substantially all patterns in the mask layout; and a set of MCR mask layers, wherein substantially all patterns in each MCR mask layer relate to patterns in the mask layout that are in proximity to the set of corners, and wherein each MCR mask layer is associated with an MCR component; and instructions for calibrating the uncalibrated process model using the set of mask layers and the process data. - View Dependent Claims (16, 17, 18, 19, 20, 21)
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Specification