MEASUREMENT AND CONTROL OF ELECTROMAGNETIC INTERFERENCE

• US 20100148883A1
• Filed: 12/12/2008
• Published: 06/17/2010
• Est. Priority Date: 12/12/2008
• Status: Active Grant

• Current Assignee: Lenovo International Limited (Lenovo Group Ltd.)
• Original Assignee: International Business Machines Corporation
• Inventors: Crowder, Michael H., Bodette, Edward J., Rehquate, Rudolf E.
• Granted Patent: US 8,502,618 B2
• Time in Patent Office: Days
• US Class Current: 333/17.100
• CPC Class Codes: H04B 15/02 Reducing interference from electric apparatus by means located at or near the interfering apparatus
• CPC Class Codes: H04B 3/46 Monitoring; Testing

Abstract

The average EMR emissions of an electronic device may be reduced by implementing an electrically-active modulated termination. For example, the impedance may be continuously varied at one or more termination locations between two metal substructures to cause a like variation in the amplitude of each component of the EMR. According to one approach, cyclically varying the electrical impedance with a period of less than the time interval over which the EMR is measured will result in a reduction in the average measured EMR.

Claims

1. A method, comprising:

continuously varying an electrical impedance at one or more termination locations between first and second substructures that radiate electromagnetic noise to continuously vary the amplitude of the electromagnetic noise at a particular frequency.

2. The method of claim 1, further comprising:

simultaneously varying the electrical impedance at a plurality of termination locations between two metal substructures.

3. The method of claim 2, wherein the termination locations are spaced at a distance of less than about a maximum value of the wavelength of the electromagnetic noise component.

4. The method of claim 1, wherein the step of varying an electrical impedance at one or more termination locations between the first and second substructures comprises flowing electrical current through one or more spaced-apart PIN diodes coupling the first and second metal substructures and varying the electrical current to vary the resistance of the PIN diodes.

5. The method of claim 1, further comprising:

receiving a portion of the electromagnetic noise within a selected bandwidth;

averaging the intensity of the received portion of the electromagnetic noise over a selected sampling interval; and

cyclically varying the electrical impedance with a period of less than the sampling interval.

6. The method of claim 5, further comprising:

comparing the average intensity to a threshold value; and

decreasing the period of varying the electrical impedance in response to the average intensity exceeding the threshold value.

7. An electronic system, comprising:

a signal generator for generating an electronic signal;

a first metal substructure and a second metal substructure electrically coupled to the electrical signal generator for radiating electromagnetic noise from the signal generator; and

an impedance controller for continuously varying the impedance at one or more termination locations between the two metal substructures to continuously vary the amplitude of the electromagnetic noise at a particular frequency of the electromagnetic noise.

8. The electronic system of claim 7, wherein the impedance controller further comprises:

a PIN diode at each of the one or more termination locations; and

a variable current supply having a control circuit for supplying a continuously varying electrical current across the PIN diodes.

9. The electronic system of claim 8, wherein the impedance controller further comprises:

a ferrite bead coupling the first metal substructure to ground; and

a capacitor in series between each PIN diode and the second metal substructure.

10. The electronic system of claim 7, further comprising

an EMI receiver for receiving a portion of the electromagnetic noise within a selected bandwidth and averaging the intensity of the received electromagnetic noise over a selected sampling interval;

and

wherein the impedance controller is configured to cyclically vary the electrical impedance with a period of less than the averaging sampling interval.

11. The electronic system of claim 10, further comprising a comparator for comparing the averaged intensity to a threshold value and outputting an indication of the comparison.

12. The electronic system of claim 7, wherein the first metal substructure comprises the ground plane of a multi-layered circuit board and the second metal substructure comprises a bracket for mounting the circuit board.

13. The electronic system of claim 7, wherein the first metal substructure comprises the ground plane of a multi-layered circuit board and the second metal substructure comprises a heatsink mounted to the circuit board.

14. The electronic system of claim 7, wherein the first metal substructure comprises the ground plane of a multi-layered circuit board and the second metal substructure comprises an enclosure in which the circuit board is mounted.