SOLDER JOINTS WITH ENHANCED ELECTROMIGRATION RESISTANCE
First Claim
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3-1. The device of claim 1, wherein the solder material consists of:
- 0.4 to 1.0 weight percent Cu;
greater than 0 and up to 2 weight percent Ag;
greater than 0 and up to 2 weight percent Bi; and
the balance being Sn and unavoidable impurities.
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Abstract
Electronic assemblies and solders used in electronic assemblies are described. One embodiment includes a die and a substrate, with a solder material positioned between the die and the substrate, the solder comprising at least 91 weight percent Sn, 0.4 to 1.0 weight percent Cu and at least one dopant selected from the group consisting of Ag, Bi, P, and Co. Other embodiments are described and claimed.
30 Citations
15 Claims
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3-1. The device of claim 1, wherein the solder material consists of:
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0.4 to 1.0 weight percent Cu; greater than 0 and up to 2 weight percent Ag; greater than 0 and up to 2 weight percent Bi; and the balance being Sn and unavoidable impurities.
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13. A method comprising:
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providing a solder material on at least one of a substrate and a die, the solder material comprising Sn, 0.4 to 1.0 weight percent of Cu, and at least one dopant selected from the group consisting of Ag, Bi, P, Co; heating the solder material to a temperature so that it reflows; coupling the die and substrate together through the solder material; and solidifying the solder material after the reflow; wherein the coupling the die and substrate together is carried out using a method selected from the group consisting of;
coupling the die and substrate together through the solder prior the reflow, and coupling the die and substrate together through the solder after the solder reflow. - View Dependent Claims (14, 15)
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Specification