Method for testing an electronics unit

• US 20100164506A1
• Filed: 10/02/2007
• Published: 07/01/2010
• Est. Priority Date: 10/04/2006
• Status: Active Grant

• Current Assignee: Endress + Hauser GmbH + Company KG (Endress+Hauser AG)
• Original Assignee: Endress + Hauser GmbH + Company KG (Endress+Hauser AG)
• Inventors: Schauble, Harald, Grittke, Udo, Humpert, Axel, Fruhauf, Dietmar
• Granted Patent: US 8,274,295 B2
• Time in Patent Office: Days
• US Class Current: 324/537
• CPC Class Codes: G01R 31/2829 Testing of circuits in sensor or actuator systems testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844

Abstract

A method for testing an electronics unit, especially an electronics unit of an apparatus for ascertaining and/or monitoring a process variable, wherein the electronics unit has a plurality of electrical components. At least a part of the electrical components is grouped into at least one group, and this group is supplied with a query signal. A response signal is received from the group, and the response signal is evaluated. Furthermore, the invention relates to an apparatus for determining and/or monitoring a process variable.

Claims

1-11. -11. (canceled)

12. A method for testing an electronics unit, especially an electronics unit of an apparatus for ascertaining and/or monitoring a process variable, said electronics unit having a plurality of electrical components, comprising the steps of:

growing at least one part of the electrical components into at least one group;

supplying a query signal to the group;

receiving a response signal from the group; and

evaluating the response signal.

13. The method as claimed in claim 12, further comprising the steps of:

comparing the response signal with a desired value.

14. The method as claimed in claim 13, wherein:

by comparison of the response signal with a desired value, a prediction is made concerning future behavior of the components of the group, from which the response signal was received.

15. The method as claimed in claim 14, wherein:

by the comparison of the response signal with the desired value, a prediction is made concerning expected lifetime of the components of the group, from which the response signal was received.

16. The method as claimed in claim 12, further comprising the steps of:

measuring a voltage drop across the group; and

as a result evaluating the measured voltage drop.

17. The method as claimed in claim 12, wherein:

the group is formed according to failure rate of components.

18. The method as claimed in claim 12, wherein:

the group is formed according to function of components in the electronics unit.

19. The method as claimed in claim 12, wherein:

at least the measuring of the voltage drop is done with at least one analog-digital converter, which is not used for a function of the electronics unit.

20. The method as claimed in claim 12, wherein:

the group is modified and/or expanded in such a manner, that a change of at least one component of the group leads to a change of the response signal receivable from the group.

21. An apparatus for ascertaining and/or monitoring at least one process variable, comprising:

at least one sensor element;

at least one electronics unit; and

at least one control unit, wherein;

said electronics unit includes a plurality of electrical components;

said at least one control unit is embodied in such a manner, that it supplies at least one group of at least a part of the components with a query signal, and receives a response signal from the group; and

said least least one control unit evaluates the response signal with respect to changes of components of the group.

22. The apparatus as claimed in claim 21, further comprising:

at least one analog-digital converter, which is free of measuring tasks and via which said control unit receives the response signal.