PRODUCT VERIFICATION SYSTEM

• US 20100168899A1
• Filed: 12/30/2009
• Published: 07/01/2010
• Est. Priority Date: 12/30/2008
• Status: Abandoned Application

• Current Assignee: Princeton Technology Corporation
• Original Assignee: Princeton Technology Corporation
• Inventors: Chang, Chih-Kai, Teng, Cheng-Yung
• Application Number:
  US12/650,391
• Publication Number:
  US 20100168899A1
• Time in Patent Office: Days
• US Class Current: 700/110
• CPC Class Codes: G01R 31/2831 Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates G01R31/318511 takes precedence; testing during manufacture H01L22/00
• CPC Class Codes: G08C 23/00 Non-electrical signal transmission systems, e.g. optical systems
• CPC Class Codes: H01L 21/67271 Sorting devices

Abstract

A product verification system with at least two machines that communicate with each other by an inferred mechanism is provided. The first machine is a handler and the second machine is a tester. The second machine is coupled to a product, and performs a test procedure on the product according to a test command from the first machine. The test result is collected and transmitted back to the first machine by the second machine.

Claims

1. A system for product verification, comprising:

a first machine for controlling the system; and

a second machine receiving a test command from the first machine to perform a test procedure on a product according to the test command, and then to transmit a test result to the first machine,

wherein the first and second machines communicate with each other by an inferred (IR) means.

2. The system as claimed in claim 1, wherein the first machine comprises:

a first IR transceiving module for transmitting the test command to the second machine and receiving the test result from the second machine;

a first control unit for providing the first IR transceiving module with the test command transmitted to the second machine; and

a storage unit storing the test result received by the first IR transceiving module.

3. The system as claimed in claim 1, wherein the second machine comprises:

a second IR transceiving module for receiving the test command from the first machine and transmitting the test result to the first machine; and

a second control unit for testing the product according to the test command received by the second IR transceiving module, and collecting the test result transmitted to the first machine by the second IR transceiving module.

4. The system as claimed in claim 2, wherein the first control unit uses parallel communication.

5. The system as claimed in claim 4, wherein the first IR transceiving module comprises:

a first parallel-to-serial converting module coupled to the first control unit for converting the test command from a parallel format to a serial format;

a first transmitting processing unit for generating an IR modulated test command by loading the serial format test command with an identification code (ID code) and then performing an IR modulation process to the serial format test command loaded with the ID code; and

a first IR transmitter for transmitting the IR modulated test command by the IR modulation process.

6. The system as claimed in claim 4, wherein the first IR transceiving module further comprises:

a first IR receiver for receiving an IR signal;

a first receiving processing unit coupled to the first IR receiver for receiving the IR signal, performing an IR demodulation process on the IR signal and identifying an identification code (ID code) thereof to obtain the test result from the second machine; and

a first serial-to-parallel converting module coupled to the first receiving processing unit for receiving the test result and converting the test result from a serial format to a parallel format to be sent to the first control unit.

7. The system as claimed in claim 3, wherein the second control unit uses parallel communication.

8. The system as claimed in claim 7, wherein the second IR transceiving module further comprises:

a second IR receiver for receiving an IR signal;

a second receiving processing unit coupled to the second IR receiver for receiving the IR signal, performing an IR demodulation process on the IR signal and identifying an identification code (ID code) thereof to obtain the test command from the first machine; and

a second serial-to-parallel converting module coupled to the second receiving processing unit for receiving the test command and converting the test command from a serial format to a parallel format to be sent to the second control unit.

9. The system as claimed in claim 7, wherein the second IR transceiving module comprises:

a second parallel-to-serial converting module coupled to the second control unit for receiving the test result, and converting the test result from a parallel format to a serial format;

a second transmitting processing unit for generating an IR modulated test result by loading the serial format test result with an identification code (ID code) and then performing an IR modulation process to the serial format test result loaded with the ID code; and

a second IR transmitter for transmitting the IR modulated test result by infrared.

10. The system as claimed in claim 1, wherein the product is a die on a wafer or a separate die sliced from a wafer.

11. The system as claimed in claim 1, wherein the test procedure is a wafer probe test or an electrical characteristic test.

12. A system for product verification, comprising:

a). a first machine for controlling the system and wherein the first machine includes;

a first inferred (IR) transceiving module for transmitting or receiving data by an IR means;

a first control unit for providing a test command to the the first IR transceiving module transmitted by the first IR transceiving module;

a storage unit for storing data received by the first IR transceiving module; and

b). a second machine, wherein the second machine includes;

a second IR transceiving module for receiving the test command transmitted from the first IR transceiving module and transmitting a test result by infrared;

a second control unit for performing a test procedure on a product according to the test command received by the second IR transceiving module and collecting the test result transmitted by the second transceiving module.

13. The system as claimed in claim 12, wherein the first control unit uses parallel communication.

14. The system as claimed in claim 13, wherein the first IR transceiving module comprises:

a first parallel-to-serial converting module coupled to the first control unit for receiving the test command, and converting the test command from a parallel format to a serial format;

a first transmitting processing unit for generating an IR modulated test command by loading the serial format test command with an identification code (ID code) and then performing an IR modulation process to the serial format test command loaded with the ID code; and

a first IR transmitter for transmitting the IR modulated test command by infrared.

15. The system as claimed in claim 13, wherein the first IR transceiving module further comprises:

a first IR receiver for receiving an 1R signal;

a first receiving processing unit coupled to the first IR receiver for receiving the IR signal, performing an IR demodulation process on the IR signal and identifying an identification code (ID code) thereof to obtain the test result from the second machine; and

a first serial-to-parallel converting module coupled to the first receiving processing unit for receiving the test result and converting the test result from a serial format to a parallel format to be sent to the first control unit.

16. The system as claimed in claim 12, wherein the second control unit uses parallel communication.

17. The system as claimed in claim 16, wherein the second IR transceiving module further comprises:

a second IR receiver for receiving an IR signal;

a second receiving processing unit coupled to the second IR receiver for receiving the IR signal, performing an IR demodulation process on the IR signal and identifying an identification code (ID code) thereof to obtain the test command from the first machine; and

a second serial-to-parallel converting module coupled to the second receiving processing unit for receiving the test command and converting the test command from a serial format to a parallel format to be sent to the second control unit.

18. The system as claimed in claim 16, wherein the second IR transceiving module comprises:

a second parallel-to-serial converting module coupled to the second control unit for receiving the test result, and converting the test result from a parallel format to a serial format;

a second transmitting processing unit for generating an IR modulated test result by loading the serial format test result with an identification code (ID code) and then performing an IR modulation process to the serial format test result loaded with the ID code; and

a second IR transmitter, transmitting the IR modulated test result by infrared.

19. The system as claimed in claim 12, wherein the product is a die on a wafer or a separate die sliced from a wafer.

20. The system as claimed in claim 19, wherein the test procedure is a wafer probe test or an electrical characteristics test.