TEST SYSTEM FOR SEMICONDUCTOR DEVICES BASED ON NETWORK MONITORING

• US 20100169481A1
• Filed: 12/02/2009
• Published: 07/01/2010
• Est. Priority Date: 12/31/2008
• Status: Abandoned Application

• Current Assignee: Princeton Technology Corporation
• Original Assignee: Princeton Technology Corporation
• Inventors: Hung, Tsan-Fu
• Application Number:
  US12/629,557
• Publication Number:
  US 20100169481A1
• Time in Patent Office: Days
• US Class Current: 709/224
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

A test system for semiconductor devices based on network monitoring is disclosed. The test system includes a testing apparatus, a test system server and one or more control terminals. The test system server wirelessly receives the test request transmitted from the testing apparatus, the control terminals, the designing apparatus or the manufacturing apparatus. According to the test request, the test system sever wirelessly transmits the test information to the testing apparatus to proceed with a test process for a semiconductor device.

Claims

1. A test system for semiconductor devices using network monitoring, comprising:

a testing apparatus for testing a semiconductor device through a test process;

a test system server wirelessly transmitting a test information to the testing apparatus for the test process and wirelessly receiving a test result from the testing apparatus; and

one or more control terminals wirelessly receiving the test information from the test system server to wirelessly transmit the test information to the testing apparatus for the test process,

wherein the test system server wirelessly receives a test request transmitted from a designing apparatus, a manufacturing apparatus, or the control terminals and wirelessly transmits the test result to the designing apparatus, the manufacturing apparatus or the control terminals.

2. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the test system server wirelessly transmits the test information to the testing apparatus for the test process for the semiconductor device according to the test request.

3. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the test system server analyzes the test result to obtain data for analysis.

4. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the test system server wireless transmits the data for analysis to the control terminals, the designing apparatus, the manufacturing apparatus or the testing apparatus.

5. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the control terminals wirelessly download test schedules from the test system server.

6. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the test system server verifies the control terminals, the designing apparatus, the manufacturing apparatus, or the testing apparatus transmitting the test request.

7. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the test process comprises electrical characteristic testing or wafer probe testing.

8. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the test system server comprises:

a control unit, controlling operations of the test system server;

a database unit, coupled to the control unit, storing data of the test system server;

a test-data generating unit, coupled to the control unit, analyzing the test results transmitted from the testing apparatus and generating the test data;

an analysis unit, coupled to the control unit, analyzing the test results transmitted from the testing apparatus and generating data for analysis;

a wireless transmitting unit, coupled to the control unit, providing wireless transmission;

an input/output unit, coupled to the control unit, providing an input or output interface; and

a verifying unit, coupled to the control unit, verifying the test request.

9. The test system for semiconductor devices based on network monitoring as claimed in claim 8, wherein data stored in the database unit comprises data or software performed by the control unit, the test data and the test result, and user data and authority for one or more of the testing apparatuses, the control terminals, the designing apparatuses, and the manufacturing apparatuses.

10. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the test data comprises test vectors, test commands, or combinations thereof.

11. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the designing apparatus designs a constitution of the semiconductor device.

12. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the manufacturing apparatus manufactures products of the semiconductor device.

13. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the control terminals comprise portable devices or mobile terminals.

14. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the semiconductor device comprises uncut dies or singularized dies on a wafer.

15. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein transmission between the control terminals and the testing apparatus and transmission between the testing and the test system server is implemented by infrared transmission.

16. The test system for semiconductor devices based on network monitoring as claimed in claim 1, wherein the testing apparatus comprises:

a testing station, receiving the test information transmitted from the control terminals or the test system server via a transmission path, implementing the test process on the semiconductor device based on the test information, and transmitting the test result to the control terminals of the test system server;

a first controller, electronically coupled to the testing station, receiving the test information; and

one or more second controllers, electronically coupled to the testing station, controlling the test process of the testing station, wherein each of the second controllers corresponds to one or more of the semiconductor devices under test,

wherein the first controller broadcasts the test information to one or more of the second controllers via infrared transmission and receives the test result transmitted from the second controllers via infrared transmission.

17. A test system for semiconductor devices using network monitoring, comprising:

a testing apparatus for testing a semiconductor device through a test process; and

a test system server wirelessly transmitting a test information to the testing apparatus for the test process and wirelessly receiving a test result from the testing apparatus,

wherein the test system server wirelessly receives a test request transmitted from a designing apparatus, a manufacturing apparatus, or the testing apparatus and wirelessly transmits the test result to the designing apparatus or the manufacturing apparatus.