×

TEST SYSTEM FOR SEMICONDUCTOR DEVICES BASED ON NETWORK MONITORING

  • US 20100169481A1
  • Filed: 12/02/2009
  • Published: 07/01/2010
  • Est. Priority Date: 12/31/2008
  • Status: Abandoned Application
First Claim
Patent Images

1. A test system for semiconductor devices using network monitoring, comprising:

  • a testing apparatus for testing a semiconductor device through a test process;

    a test system server wirelessly transmitting a test information to the testing apparatus for the test process and wirelessly receiving a test result from the testing apparatus; and

    one or more control terminals wirelessly receiving the test information from the test system server to wirelessly transmit the test information to the testing apparatus for the test process,wherein the test system server wirelessly receives a test request transmitted from a designing apparatus, a manufacturing apparatus, or the control terminals and wirelessly transmits the test result to the designing apparatus, the manufacturing apparatus or the control terminals.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×