SPIN-ON SPACER MATERIALS FOR DOUBLE- AND TRIPLE-PATTERNING LITHOGRAPHY
First Claim
1. A method of forming a microelectronic structure, said method comprising:
- providing a precursor structure having a patterned surface, said patterned surface including at least one raised feature having first and second sidewalls and an upper surface;
applying a shrinkable composition to said patterned surface, said composition covering said feature sidewalls and upper surface;
heating said shrinkable composition so as to form a conformal layer of said composition on said patterned surface and over said feature; and
removing at least some of said conformal layer to yield a pre-spacer structure comprising said feature and remnants of said conformal layer against said feature sidewalls.
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Abstract
Novel double- and triple-patterning methods are provided. The methods involve applying a shrinkable composition to a patterned template structure (e.g., a structure having lines) and heating the composition. The shrinkable composition is selected to possess properties that will cause it to shrink during heating, thus forming a conformal layer over the patterned template structure. The layer is then etched to leave behind pre-spacer structures, which comprise the features from the pattern with remnants of the shrinkable composition adjacent the feature sidewalls. The features are removed, leaving behind a doubled pattern. In an alternative embodiment, an extra etch step can be carried out prior to formation of the features on the template structure, thus allowing the pattern to be tripled rather than doubled.
433 Citations
20 Claims
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1. A method of forming a microelectronic structure, said method comprising:
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providing a precursor structure having a patterned surface, said patterned surface including at least one raised feature having first and second sidewalls and an upper surface; applying a shrinkable composition to said patterned surface, said composition covering said feature sidewalls and upper surface; heating said shrinkable composition so as to form a conformal layer of said composition on said patterned surface and over said feature; and removing at least some of said conformal layer to yield a pre-spacer structure comprising said feature and remnants of said conformal layer against said feature sidewalls. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification