Self-Testing, Monitoring and Diagnostics in Grouped Circuitry Modules

• US 20100171512A1
• Filed: 03/22/2010
• Published: 07/08/2010
• Est. Priority Date: 11/30/2006
• Status: Active Grant

• Current Assignee: Electro Scientific Industries Incorporated (MKS Instruments Incorporated)
• Original Assignee: Electro Scientific Industries Incorporated (MKS Instruments Incorporated)
• Inventors: Almonte, Kenneth V.
• Granted Patent: US 8,090,551 B2
• Time in Patent Office: Days
• US Class Current: 324/555
• CPC Class Codes: G01R 31/016 Testing of capacitors measuring capacitance G01R27/2605

Abstract

An electrical test system for providing a power source to each of a plurality of electrical components under electrical test includes a grouped circuitry module. The grouped circuitry module includes a plurality of individually-programmable power sources, each coupled to an output channel, a controller configured to program each of the power sources to a respective stimulus output value and to read a measured value at each corresponding output channel and random access, non-volatile, memory for storing information and for providing read/write capability for the controller. A host computer is in communication with the controller for running a self test program that sequentially programs each of the power sources to its respective stimulus output value and reads the measured value at each corresponding output channel using the controller to determine if the tested complete subsystem is operating properly.

Claims

1-20. -20. (canceled)

21. An electrical test system for providing a power source to each of a plurality of electrical components under electrical test, comprising:

a grouped circuitry module including;

a plurality of individually-programmable power sources, each coupled to an output channel;

a controller configured to program each of the power sources to a respective stimulus output value and to read a measured value at each corresponding output channel; and

random access, non-volatile memory for storing information and for providing read/write interface capability for the controller; and

a host computer in communication with the controller for running a self test program that sequentially programs each of the power sources to its respective stimulus output value and reads the measured value at each corresponding output channel using the controller to determine if the tested complete subsystem is operating properly.

22. The electrical test system according to claim 21, further comprising:

at least one output sensor associated with each output channel for reading the measured value.

23. The electrical test system according to claim 22, further comprising:

an analog-to-digital converter coupled between each output channel and the controller to convert the measured value at the output channel to a digital value for input to the controller.

24. The electrical test system according to claim 23, further comprising:

a digital-to-analog converter coupled between at least certain of the plurality of individually-programmable power sources and the controller for converting those stimulus output values of the at least certain of the plurality of individually-programmable power sources from a digital value to an analog value.

25. The electrical test system according to claim 21, further comprising:

a digital-to-analog converter coupled between at least certain of the plurality of individually-programmable power sources and the controller for converting those stimulus output values of the at least certain of the plurality of individually-programmable power sources from a digital value to an analog value.

26. The electrical test system according to claim 21 wherein the controller comprises a field programmable gate array.

27. The electrical test system according to claim 21, further comprising:

at least one temperature sensor for monitoring the plurality of individually-programmable power sources.

28. The electrical test system according to claim 27 wherein the controller is further configured to compare a measured temperature value from the at least one temperature sensor to a threshold value and to, if the threshold value is exceeded, shut down a one of the plurality of individually-programmable power sources generating excess heat.

29. The electrical test system according to claim 21 wherein at least one of the controller and the host computer is configured to determine if the tested complete subsystem is operating properly by comparing the measured value at each corresponding output channel to a range about the respective stimulus output value.

30. The electrical test system according to claim 21 wherein the host computer is configured to run the self test program upon power-up of the electrical test system.

31. The electrical test system according to claim 21 wherein the plurality of individually-programmable power sources comprises at least two current sources, and the respective stimulus output value for each of the at least two current sources includes a test current waveform.

32. The electrical test system according to claim 21 wherein the plurality of individually-programmable power sources comprises at least two voltage sources, and the respective stimulus output value for each of the at least two voltage sources includes a test voltage waveform.

33. The electrical test system according to claim 21 wherein the controller is configured to interact with information stored in random access non-volatile memory and wherein the information comprises at least one of cumulative board operating time, maximum board operating temperature, average board operating temperature, maximum board output condition, average board output condition, internal board identification information, electronic board serial number, board manufacturing date, board manufacturing location, board firmware version, board software version, average ambient temperature, maximum ambient temperature, average heat sink temperature, maximum heat sink temperature, average voltage output, maximum voltage output, average current output, maximum current output, last circuit test date and last circuit test result.

34. The electrical test system according to claim 21 wherein the plurality of individually-programmable power sources comprises a first current source coupled to a first output channel and a first voltage source coupled to the first output channel, the electrical test system further comprising:

an output voltage sensor coupled to the first output channel and in communication with the controller for determining if a stimulus output value from the first voltage source has been successfully delivered; and

an output current sensor coupled to the first output channel and in communication with the controller for determining if a programmed current value from the programmable current source has been successfully delivered.