MICROELECTRONIC SENSOR DEVICE WITH LIGHT SOURCE AND LIGHT DETECTOR

• US 20100187450A1
• Filed: 06/18/2008
• Published: 07/29/2010
• Est. Priority Date: 06/21/2007
• Status: Abandoned Application

• Current Assignee: Koninklijke Philips N.V.
• Original Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Inventors: Kahlman, Josephus Arnoldus Henricus Maria, Verschuren, Coen Adrianus
• Application Number:
  US12/665,068
• Publication Number:
  US 20100187450A1
• Time in Patent Office: Days
• US Class Current: 250/573
• CPC Class Codes: G01N 2021/0378 Shapes
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 21/4788 Diffraction for sizing particles G01N15/0205
• CPC Class Codes: G01N 21/552 Attenuated total reflection
• CPC Class Codes: G01N 21/648 using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
• CPC Class Codes: G01N 2201/0624 Compensating variation in output of LED source
• CPC Class Codes: G01N 2201/0625 Modulated LED
• CPC Class Codes: G01N 2201/124 Sensitivity

Abstract

The invention relates to a method and a microelectronic sensor device for making optical examinations in an investigation region (3). An input light beam (L1) is emitted by a light source (20) into said investigation region (3), and an output light beam (L2) coming from the investigation region (3) is detected by a light detector (30) providing a measurement signal (X). An evaluation unit (40) provides a result signal (R) based on a characteristic parameter (e.g. the intensity) of the input light beam (L1) and the output light beam (L2). Preferably, the input light beam (L1) is modulated with a given frequency (ω) and monitored with a sensor unit (22) that provides a monitoring signal (M). The monitoring signal (M) and the measurement signal (X) can then be demodulated with respect to the monitoring signal, and their ratio can be determined. This allows to obtain a result signal (R) that is largely independent of environmental influences and variations in the light source.

Claims

1. A microelectronic sensor device for optical examinations in an investigation region (3) of a carrier (5), comprising

a) a light source (20) for emitting an input light beam (L1) with a time-varying characteristic parameter towards the investigation region (3);

b) a light detector (30) for providing a measurement signal (X) that is correlated to the characteristic parameter of an output light beam (L2) coming from the investigation region (3);

c) an evaluation unit (40, 140, 240) that provides a result signal (R) based on the characteristic parameters of the input light beam (L1) and the output light beam (L2).

2. The microelectronic sensor device according to claim 1,

characterized in that the characteristic parameter is the intensity of the associated light beam (L1, L2) in a given spectral range.

3. The microelectronic sensor device according to claim 1,

characterized in that the output light beam (L2) comprises light of the input light beam (L1) that was totally internally reflected in the investigation region (3).

4. The microelectronic sensor device according to claim 1,

characterized in that the light source (20) comprises a sensor unit (22) for providing a monitoring signal (M) that is correlated to the characteristic parameter of the input light beam (L1).

5. The microelectronic sensor device according to claim 1,

characterized in that the light source (20) comprises a feedback control loop (22, 23, 24, 25) for controlling the characteristic parameter of the input light beam (L1).

6. The microelectronic sensor device according to claim 1,

characterized in that the light source (20) comprises a modulation unit (24) for modulating the characteristic parameter of the input light beam (L1).

7. The microelectronic sensor device according to claim 1,

characterized in that it comprises a high-pass filter (41, 41′

, 141, 141′

, 241) for filtering the input signals of the evaluation unit (40, 140, 240).

8. The microelectronic sensor device according to claim 4,

characterized in that the evaluation unit (40, 140, 240) comprises a demodulator (42, 43, 42′

, 43′

, 142, 143, 142′

, 143′

, 242, 243) for demodulating the measurement signal (X) and/or the monitoring signal (M) with respect to a modulated component of the monitoring signal (M).

9. The microelectronic sensor device according to claim 8,

characterized in that the evaluation unit (40, 140, 240) comprises a divider (44, 144, 244) for determining the ratio of the demodulated monitoring signal (M) and the demodulated measurement signal (M).

10. The microelectronic sensor device according to claim 1,

characterized in that the evaluation unit (240) comprises a multiplexing switch (249) for alternately passing the monitoring signal (M) or the measurement signal (X) to a shared processing hardware (241-246).

11. The microelectronic sensor device according to claim 10,

characterized in that the evaluation unit (240) comprises a storage unit (247, 248) for temporarily storing processing results of the shared processing hardware (241-246).

12. The microelectronic sensor device according to claim 1,

characterized in that it comprises an analogue-to-digital converter (145, 145′

, 245) for converting analogue signals into digital signals for further processing.

13. The microelectronic sensor device according to claim 1,

characterized in that the carrier (5) comprises at least one hole or groove (52) in the surface of the carrier (5), whereby the hole or groove (52) has a cross section with two oppositely slanted opposing facets (53, 54), particularly a triangular cross section.

15. Use of the microelectronic sensor device according to claim 1 for molecular diagnostics, biological sample analysis, or chemical sample analysis.

14. A method for making optical examinations in an investigation region (3) of a carrier (5), comprising

a) emitting an input light beam (L1) with a time-varying characteristic parameter towards the investigation region (3);

b) providing a measurement signal (X) that is correlated to the characteristic parameter of an output light beam (L2) coming from the investigation region (3);

c) providing a result signal (R) based on the characteristic parameters of the input light beam (L1) and the output light beam (L2).