TEMPERATURE SENSING CIRCUIT OF SEMICONDUCTOR DEVICE
First Claim
1. A temperature sensing circuit of a semiconductor device, comprising:
- a code signal generator configured to output a first count signal having an increase rate that varies according to a change in temperature;
a comparator configured to receive the first count signal and a control signal, compare the first count signal with the control signal, and output a comparison signal;
a reference clock generator configured to generate a reference clock having a uniform period regardless of the change in temperature during an activation period of the comparison signal; and
a final temperature code signal generator configured to count pulses of the reference clock, generate a second count signal, modify the second count signal using an offset value, and output the modified second count signal as a final temperature code signal.
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Abstract
A temperature sensing circuit of a semiconductor device includes a code signal generator, a comparator, a reference clock generator and a final temperature code signal generator. The code signal generator is configured to output a first count signal having an increase rate that varies according to a change in temperature. The comparator is configured to receive the first count signal and a control signal, compare the first count signal with the control signal and output a comparison signal. The reference clock generator is configured to generate a reference clock having a uniform period regardless of the change in temperature during an activation period of the comparison signal. The final temperature code signal generator is configured to count pulses of the reference clock, generate a second count signal, modify the second count signal using an offset value, and output the modified second count signal as a final temperature code signal.
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Citations
9 Claims
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1. A temperature sensing circuit of a semiconductor device, comprising:
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a code signal generator configured to output a first count signal having an increase rate that varies according to a change in temperature; a comparator configured to receive the first count signal and a control signal, compare the first count signal with the control signal, and output a comparison signal; a reference clock generator configured to generate a reference clock having a uniform period regardless of the change in temperature during an activation period of the comparison signal; and a final temperature code signal generator configured to count pulses of the reference clock, generate a second count signal, modify the second count signal using an offset value, and output the modified second count signal as a final temperature code signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification