MOUNTED COMPONENT INSPECTION APPARATUS, COMPONENT MOUNTING MACHINE COMPRISING THE MOUNTED COMPONENT INSPECTION APPARATUS, AND MOUNTED COMPONENT INSPECTION METHOD

• US 20100189340A1
• Filed: 01/29/2010
• Published: 07/29/2010
• Est. Priority Date: 01/29/2009
• Status: Active Grant

• Current Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Original Assignee: Panasonic Corporation (Panasonic Holdings Corporation)
• Inventors: Ueda, Yoichiro
• Granted Patent: US 8,406,503 B2
• Time in Patent Office: Days
• US Class Current: 382/145
• CPC Class Codes: G01N 21/956 Inspecting patterns on the surface of objects contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H01L22/10
• CPC Class Codes: Y10T 29/53013 Computer input
• CPC Class Codes: Y10T 29/53174 Means to fasten electrical component to wiring board, base, or substrate

Abstract

A mounted component inspection apparatus according to the present invention includes: a component library holding inspection information; an inspection processing unit for inspecting a component under inspection using the component library; a match rate acquisition unit for acquiring a match rate indicating the degree to which the inspection information is suitable for the inspection by the inspection processing unit, on the basis of the result of the inspection by the inspection processing unit; and a judgment unit for selecting the inspection information having a higher match rate, of the inspection information before updating and the inspection information after updating. The component library can hold the inspection information before and after updating, and the inspection processing unit carries out the inspection using the inspection information before and after updating held in the component library.

Claims

1. A mounted component inspection apparatus comprising:

an inspection processing unit for inspecting a component under inspection by using a component library holding updatable inspection information to be used in the inspection of the component under inspection;

a match rate acquisition unit for acquiring a match rate that indicates a degree to which the inspection information is suitable for the inspection by the inspection processing unit, on a basis of a result of the inspection by the inspection processing unit; and

a judgment unit for selecting the inspection information having a higher match rate, of the inspection information before updating and the inspection information after updating,

wherein the component library can hold the inspection information before and after updating, and

the inspection processing unit carries out the inspection using the inspection information before and after updating held in the component library, and when the selection is made by the judgment unit, the inspection processing unit carries out the inspection using the inspection information selected by the judgment unit.

2. The mounted component inspection apparatus according to claim 1, further comprising a component library control unit for, when information for updating the inspection information is input, causing the component library to hold the inspection information updated on a basis of the input information.

3. The mounted component inspection apparatus according to claim 1, further comprising a point of difference reporting unit for reporting points of difference in the inspection information before and after updating.

4. The mounted component inspection apparatus according to claim 1, further comprising a match rate reporting unit for reporting the match rate acquired by the match rate acquisition unit.

5. The mounted component inspection apparatus according to claim 1, wherein the match rate is a value obtained by dividing a count value obtained by counting OK information indicating that the result of the inspection by the inspection processing unit using the inspection information is satisfactory, by a total number of times that the inspection information has been used.

6. The mounted component inspection apparatus according to claim 1, further comprising an excessive judgment rate acquisition unit for acquiring an excessive judgment rate indicating a ratio of excessive judgments that have been made, on a basis of information indicating that the judgment is excessive.

7. The mounted component inspection apparatus according to claim 6, wherein the excessive judgment rate is a value obtained by dividing a count value obtained by counting the information indicating that the judgment is excessive, by a number of times that the inspection processing unit has judged the inspection result to be unsatisfactory.

8. The mounted component inspection apparatus according to claim 1, wherein a revision number is assigned to the inspection information, and the revision number has a global setting number assigned by a supplier of the component library and a local setting number which can be changed by a recipient of the component library.

9. The mounted component inspection apparatus according to claim 8, further comprising an incrementing unit for, when the inspection information after updating is selected by the judgment unit, incrementing the local setting number assigned to the inspection information after updating.

10. The mounted component inspection apparatus according to claim 1, further comprising a component library control unit for assigning, to the inspection information before and after updating, an evaluation time setting number for distinguishing between before updating and after updating.

11. A component mounting machine for mounting components on a substrate, comprising the mounted component inspection apparatus according to claim 1, wherein the components mounted on the substrate are inspected by the mounted component inspection apparatus.

12. A mounted component inspection method, comprising:

inspecting a component under inspection by using inspection information before and after updating held in a component library;

acquiring, respectively for the inspection information before and after updating, a match rate indicating a degree to which the inspection information is suitable for the inspection, on a basis of an inspection result;

selecting the inspection information having a higher match rate, on a basis of the respective match rates of the inspection information before and after updating thus acquired; and

inspecting the component under inspection using the inspection information thus selected.

13. The mounted component inspection method according to claim 12, wherein, when information for updating the inspection information is input, inspection information that is updated on a basis of the input information is held in the component library.

14. The mounted component inspection method according to claim 13, wherein the information for updating the inspection information is input when the lot of the components under inspection is changed.

15. The mounted component inspection method according to claim 12, wherein the inspection information having a lower match rate, of the inspection information before and after updating, is discarded from the component library.

16. The mounted component inspection method according to claim 12, wherein the match rate is a value obtained by dividing a count value obtained by counting OK information indicating a satisfactory result of the inspection using the inspection information, by a total number of times that the inspection information has been used.

17. The mounted component inspection method according to claim 12, wherein a revision number is assigned to the inspection information, and the revision number comprises a global setting number assigned by a supplier of the component library and a local setting number which can be changed by a recipient of the component library.

18. The mounted component inspection method according to claim 17, wherein, when the inspection information after updating is selected, the local setting number assigned to the inspection information after updating is incremented.

19. The mounted component inspection method according to claim 12, wherein, when the inspection information is updated, an evaluation time setting number for distinguishing between before updating and after updating is assigned to the inspection information before and after updating.

20. The mounted component inspection method according to claim 12, wherein the component under inspection is inspected using, together with the component library, scale conversion data and brightness correction data which are specific to equipment.