SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
First Claim
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1. A semiconductor device comprising:
- a gate electrode layer;
a gate insulating film over the gate electrode layer;
a first electrode layer and a second electrode layer whose end portions overlap with the gate electrode layer, over the gate insulating film;
a first wiring layer over the first electrode layer;
a second wiring layer over the second electrode layer; and
an oxide semiconductor layer over the gate electrode layer,wherein the first electrode layer extends beyond an end portion of the first wiring layer;
wherein the second electrode layer extends beyond an end portion of the second wiring layer;
wherein the oxide semiconductor layer is electrically connected to a side face and a top face of the first electrode layer and a side face and a top face of the second electrode layer; and
wherein the gate insulating film over the gate electrode layer has a region in contact with the oxide semiconductor layer between a region in contact with the first electrode layer and a region in contact with the second electrode layer.
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Abstract
A method for forming a thin film transistor includes steps of forming a first wiring layer over a first electrode layer and forming a second wiring layer over a second electrode layer, wherein the first electrode layer extends beyond an end portion of the first wiring layer, the second electrode layer extends beyond an end portion of the second wiring layer, and a semiconductor layer is formed so as to be electrically connected to a side face and a top face of the first electrode layer and a side face and a top face of the second electrode layer.
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Citations
11 Claims
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1. A semiconductor device comprising:
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a gate electrode layer; a gate insulating film over the gate electrode layer; a first electrode layer and a second electrode layer whose end portions overlap with the gate electrode layer, over the gate insulating film; a first wiring layer over the first electrode layer; a second wiring layer over the second electrode layer; and an oxide semiconductor layer over the gate electrode layer, wherein the first electrode layer extends beyond an end portion of the first wiring layer; wherein the second electrode layer extends beyond an end portion of the second wiring layer; wherein the oxide semiconductor layer is electrically connected to a side face and a top face of the first electrode layer and a side face and a top face of the second electrode layer; and wherein the gate insulating film over the gate electrode layer has a region in contact with the oxide semiconductor layer between a region in contact with the first electrode layer and a region in contact with the second electrode layer. - View Dependent Claims (2, 3, 4)
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5. A semiconductor device comprising:
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a first electrode layer and a second electrode layer; a first wiring layer over the first electrode layer; a second wiring layer over the second electrode layer; an oxide semiconductor layer over the first electrode layer and the second electrode layer; a gate insulating film over the oxide semiconductor layer; and a gate electrode layer overlapping with end portions of the first electrode layer and the second electrode layer with the gate insulating film therebetween, wherein the first electrode layer extends beyond an end portion of the first wiring layer; wherein the second electrode layer extends beyond an end portion of the second wiring layer; and wherein the oxide semiconductor layer is electrically connected to a side face and a top face of the first electrode layer and a side face and a top face of the second electrode layer. - View Dependent Claims (6, 7, 8)
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9. A method for manufacturing a semiconductor device, comprising the steps of:
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forming a gate electrode layer over a substrate; forming a gate insulating film over the gate electrode layer; forming a first electrode layer and a second electrode layer whose end portions overlap with the gate electrode layer, over the gate insulating film; forming a first wiring layer over the first electrode layer in such a way that the first electrode layer extends beyond an end portion of the first wiring layer, and a second wiring layer over the second electrode layer in such a way that the second electrode layer extends beyond an end portion of the second wiring layer; and forming an oxide semiconductor layer so as to be electrically connected to a side face and a top face of the first electrode layer and a side face and a top face of the second electrode layer, wherein the gate insulating film has a region in contact with the oxide semiconductor layer between a region in contact with the first electrode layer and a region in contact with the second electrode layer. - View Dependent Claims (10)
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11. A method for manufacturing a semiconductor device, comprising the steps of:
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forming a first electrode layer and a second electrode layer over a substrate; forming a first wiring layer over the first electrode layer in a such a way that the first electrode layer extends beyond an end portion of the first wiring layer, and a second wiring layer over the second electrode layer in a such a way that the second electrode layer extends beyond an end portion of the second wiring layer; forming an oxide semiconductor layer so as to be electrically connected to a side face and a top face of the first electrode layer and a side face and a top face of the second electrode layer; forming a gate insulating film over the oxide semiconductor layer; and forming a gate electrode layer overlapping with end portions of the first electrode layer and the second electrode layer with the gate insulating film therebetween.
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Specification