METHOD FOR EXAMINING A TEST SAMPLE USING A SCANNING PROBE MICRSCOPE, MEASUREMENT SYSTEM AND A MEASURING PROBE SYSTEM
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Abstract
The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method a first and a second measurement using a scanning probe microscope are carried out on the test sample using a measuring probe system in which a measuring probe and another measuring probe are formed on a common measuring probe receptacle. During the first measurement, in relation to the test sample, the measuring probe is held in a first measurement position and the other measuring probe is held in another non-measurement position, and the test sample is examined with the measuring probe using a scanning probe microscope. After the first measurement, by displacing in relation to the test sample, the measuring probe is displaced from the measurement position into a non-measurement position and the other measuring probe from the other non-measurement position into another measurement position. During the second measurement, in relation to the test sample, the measuring probe is held in the non-measurement position and the other measuring probe is held in the other measurement position, and the test sample is examined with the other measuring probe using a scanning probe microscope. The invention also relates to a measuring sensor system of a scanning probe microscope.
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Citations
42 Claims
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1-22. -22. (canceled)
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23. A method for examining a test sample using a scanning probe microscope in which:
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a first and a second measurement using a scanning probe microscope are carried out on the test sample using a measuring probe system in which a measuring probe and another measuring probe are formed on a common measuring probe receptacle, during the first measurement, in relation to the test sample, the measuring probe is held in a first measurement position and the other measuring probe is held in another non-measurement position, and the test sample is examined with the measuring probe using a scanning probe microscope, after the first measurement, by displacing in relation to the test sample, the measuring probe is displaced from the measurement position into a non-measurement position and the other measuring probe from the other non-measurement position into another measurement position, and during the second measurement, in relation to the test sample, the measuring probe is held in the non-measurement position and the other measuring probe is held in the other measurement position, and the test sample is examined with the other measuring probe using a scanning probe microscope, wherein the displacement in relation to the test sample is performed at least partly by means of a joint movement of the measuring probe and the other measuring probe which comprises a relative movement between the measuring probe receptacle and the test sample. - View Dependent Claims (24, 25, 26, 27, 28, 29, 30, 31, 32, 33)
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34. A measurement system for examining a test sample using a scanning probe microscope, said measurement system comprising:
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a measuring probe system in which a measuring probe and another measuring probe are formed on a common measuring probe receptacle, a scanning displacement means which is configured to displace the measuring probe and the other measuring probe in relation to the test sample for the examination of the test sample using a scanning probe microscope, and a measuring probe displacement means which is at least coupled to the measuring probe and the other measuring probe for the measuring probe displacement and optionally at least partly integrated with the scanning displacement means, the measuring probe displacement means being configured during a first measurement using a scanning probe microscope, to hold the measuring probe in a first measurement position and the other measuring probe in another non-measurement position in relation to the test sample, after the first measurement using a scanning probe microscope, to bring the measuring probe from the measurement position into a non-measurement position and the other measuring probe from the other non-measurement position into another measurement position by means of a joint movement which comprises a relative movement between the measuring probe receptacle and the test sample, and during a second measurement using a scanning probe microscope, to hold the measuring probe in the non-measurement position and the other measuring probe in the other measurement position. - View Dependent Claims (35, 36, 37, 38, 39, 40)
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- 41. A measuring probe system for a scanning probe microscope in which a measuring probe and at least another measuring probe are formed on a common measuring probe receptacle, wherein the measuring probe and the at least another measuring probe are displaceable each between a measurement position and a non-measurement position by means of a joint movement which comprises a relative movement between the measuring probe receptacle and the test sample.
Specification