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Continuity testing apparatus and continuity testing method including open/short detection circuit

  • US 20100225331A1
  • Filed: 03/04/2010
  • Published: 09/09/2010
  • Est. Priority Date: 03/09/2009
  • Status: Active Grant
First Claim
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1. A continuity testing apparatus for testing a condition of continuity between a semiconductor device and a mounting substrate on which the semiconductor device is mounted, the apparatus comprising:

  • an open/short detection circuit provided for each of to-be-tested terminals, and configured to determine presence or absence of at least any one of an open-circuit failure and a short-circuit failure in the to-be-tested terminal,wherein a detected result of the open/short detection circuit is generated based on a condition of continuity of the to-be-tested terminal connected to the open/short detection circuit and a detected result from an open/short detection circuit in a preceding stage, and the generated detected result is outputted to an open/short detection circuit in a succeeding stage, and the condition of continuity is determined based on an output from an open/short detection circuit in a last stage.

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