MULTI-FRAME TEST SIGNALS MODULATED BY DIGITAL SIGNAL COMPRISING SOURCE FOR TESTING ANALOG INTEGRATED CIRCUITS
First Claim
1. A method of generating multi-frame test signals for testing integrated circuits (ICs), comprising:
- providing an analog source for generating an analog source signal, said analog source signal maintained at a constant power and a constant frequency;
modulating said analog source signal with a first modulating signal to output a first test signal having first signal parameters comprising a first power level, a first frequency and a first modulation scheme; and
repeating said modulating with a second modulating signal to output a second test signal having second signal parameters comprising a second power level, a second frequency and a second modulation scheme, at least one of said second signal parameters being different as compared to said first signal parameters;
wherein said first modulating signal and said second modulating signal are both generated by a digital signal comprising source comprising a waveform memory, andcombining said first test signal and said second test signal on a first and a second frame of a multi-frame test signal comprising a plurality of frames, wherein said first test signal is positioned in said first frame and said second test signal is positioned in said second frame.
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Abstract
A method of generating multi-frame test signals, a testing apparatus, and method for testing integrated circuits (ICs) with the multi-frame test signals. An analog source generates an analog source signal at a constant power and a constant frequency that is modulated with a first modulating signal (e.g., I) to output a first test signal having first signal parameters including a power level, a frequency and a modulation scheme. The modulating is repeated with a second modulating signal (e.g., Q) to output a second test signal having second signal parameters including a power level, a frequency and a modulation scheme. At least one of the first and second signal parameters are different. The modulating signals are generated by a digital signal source. The first and second test signal are combined by placing the first test signal on the first frame (frame 1) and the second test signal on the second frame (frame 2) of the multi-frame test signal.
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Citations
26 Claims
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1. A method of generating multi-frame test signals for testing integrated circuits (ICs), comprising:
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providing an analog source for generating an analog source signal, said analog source signal maintained at a constant power and a constant frequency; modulating said analog source signal with a first modulating signal to output a first test signal having first signal parameters comprising a first power level, a first frequency and a first modulation scheme; and repeating said modulating with a second modulating signal to output a second test signal having second signal parameters comprising a second power level, a second frequency and a second modulation scheme, at least one of said second signal parameters being different as compared to said first signal parameters; wherein said first modulating signal and said second modulating signal are both generated by a digital signal comprising source comprising a waveform memory, and combining said first test signal and said second test signal on a first and a second frame of a multi-frame test signal comprising a plurality of frames, wherein said first test signal is positioned in said first frame and said second test signal is positioned in said second frame. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of testing an analog integrated circuit (IC), comprising:
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coupling a multi-frame test signal to said analog IC, said multi-frame test signal comprising; a plurality of frames, wherein a first test signal having first parameters comprising a first power level, a first frequency and a first modulation scheme and a second test signal having second parameters comprising a second power level, a second frequency and a second modulation scheme are provided on a first and a second frame of said plurality of frames, respectively, and wherein at least one of said second parameters are different as compared to said first parameters, and measuring a first output signal responsive to said first test signal and a second output signal responsive to said second test signal from said analog IC, and calculating at least one parameter for said analog IC using said first and said second output signals. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A testing apparatus for testing an analog integrated circuit (IC), comprising:
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a first testing module for generating and supplying multi-frame test signals to said analog IC; a second testing module for measuring output signals from said analog IC, wherein coupling a multi-frame test signal to said analog IC, wherein said multi-frame test signal comprises a plurality of frames, including a first test signal having first parameters comprising a first power level, a first frequency and a first modulation scheme and a second test signal having second parameters comprising a second power level, a second frequency and a second modulation scheme are provided on a first and a second frame of said plurality of frames, respectively, wherein at least one of said second parameters are different as compared to said first parameters. - View Dependent Claims (21, 22, 23, 24, 25, 26)
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Specification