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MULTI-FRAME TEST SIGNALS MODULATED BY DIGITAL SIGNAL COMPRISING SOURCE FOR TESTING ANALOG INTEGRATED CIRCUITS

  • US 20100228515A1
  • Filed: 03/06/2009
  • Published: 09/09/2010
  • Est. Priority Date: 03/06/2009
  • Status: Abandoned Application
First Claim
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1. A method of generating multi-frame test signals for testing integrated circuits (ICs), comprising:

  • providing an analog source for generating an analog source signal, said analog source signal maintained at a constant power and a constant frequency;

    modulating said analog source signal with a first modulating signal to output a first test signal having first signal parameters comprising a first power level, a first frequency and a first modulation scheme; and

    repeating said modulating with a second modulating signal to output a second test signal having second signal parameters comprising a second power level, a second frequency and a second modulation scheme, at least one of said second signal parameters being different as compared to said first signal parameters;

    wherein said first modulating signal and said second modulating signal are both generated by a digital signal comprising source comprising a waveform memory, andcombining said first test signal and said second test signal on a first and a second frame of a multi-frame test signal comprising a plurality of frames, wherein said first test signal is positioned in said first frame and said second test signal is positioned in said second frame.

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