Circuit design supporting apparatus and circuit design supporting method
First Claim
1. A circuit design supporting apparatus comprising:
- an observation portion specifying section configured to specify a first portion with a high improvement effect of analysis easiness in failure analysis of an integrated circuit as an observation portion; and
an element substitution performing section configured to substitute an element arranged in said observation portion by an analysis target element to which a failure analysis apparatus can appropriately conduct said failure analysis based on a data of said observation portion.
3 Assignments
0 Petitions
Accused Products
Abstract
A circuit design supporting apparatus includes: an observation portion specifying section configured to specify a first portion with a high improvement effect of analysis easiness in failure analysis of an integrated circuit as an observation portion; and an element substitution performing section configured to substitute an element arranged in the observation portion by an analysis target element to which a failure analysis apparatus can appropriately conduct the failure analysis based on a data of the observation portion. The element substitution performing section includes a timing analyzing section configured to perform timing analysis of the integrated circuit shown by a netlist; a delay calculating section configured to calculate a delay in the integrated circuit based on a result of the timing analysis by said timing analyzing section and said netlist; a substitution element determining section configured to specify a fine element, which is arranged in said observation portion, of elements of the integrated circuit as a substitution candidate element; and an element substituting section configured to update said netlist to form a new netlist.
13 Citations
27 Claims
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1. A circuit design supporting apparatus comprising:
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an observation portion specifying section configured to specify a first portion with a high improvement effect of analysis easiness in failure analysis of an integrated circuit as an observation portion; and an element substitution performing section configured to substitute an element arranged in said observation portion by an analysis target element to which a failure analysis apparatus can appropriately conduct said failure analysis based on a data of said observation portion. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 10, 11)
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9. The circuit design supporting apparatus according to claim B, wherein said element moving section returns said analysis target element to a position of said substitution candidate element before the substitution, when a distance between said analysis target element and said free space exceeds a predetermined value.
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12. A circuit design supporting method comprising;
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specifying, by an observation portion specifying section, a first portion with a high improvement effect of analysis easiness in failure analysis of an integrated circuit as an observation portion; and substituting, by an element substitution performing section, an element arranged in said observation portion by an analysis target element to which a failure analysis apparatus can appropriately conduct said failure analysis based on a data of said observation portion, wherein said substituting an element arranged in said observation portion comprises; performing timing analysis of the integrated circuit shown by a netlist; calculating a delay in the integrated circuit based on a result of the timing analysis and said netlist; specifying a fine element, which is arranged in said observation portion, of elements of the integrated circuit as a substitution candidate element; and updating said netlist to form a new netlist, wherein said calculating a delay comprises; calculating a delay change when substituting said element arranged in said observation portion by said analysis target element, wherein said specifying a fine element comprises; generating an instruction to said element substituting section to substitute said substitution candidate element by said analysis target element, if said delay change when said substitution candidate element is substituted by said analysis target element is within a preset timing margin, and wherein said updating comprises; forming said new netlist by substituting said substitution candidate element by said analysis target element in response to said instruction from said substitution element determining section. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
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20. A computer-readable recording medium in which a computer-executable program code is stored to realize a circuit design supporting method which comprises:
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specifying, by an observation portion specifying section, a first portion with a high improvement effect of analysis easiness in failure analysis of an integrated circuit as an observation portion; and substituting, by an element substitution performing section, an element arranged in said observation portion by an analysis target element to which a failure analysis apparatus can appropriately conduct said failure analysis based on a data of said observation portion, wherein said substituting an element arranged in said observation portion comprises; performing timing analysis of the integrated circuit shown by a netlist; calculating a delay in the integrated circuit based on a result of the timing analysis and said netlist; specifying a fine element, which is arranged in said observation portion, of elements of the integrated circuit as a substitution candidate element; and updating said netlist to form a new netlist, wherein said calculating a delay comprises; calculating a delay change when substituting said element arranged in said observation portion by said analysis target element, wherein said specifying a fine element comprises; generating an instruction to said element substituting section to substitute said substitution candidate element by said analysis target element, if said delay change when said substitution candidate element is substituted by said analysis target element is within a preset timing margin, and wherein said updating comprises; forming said new netlist by substituting said substitution candidate element by said analysis target element in response to said instruction from said substitution element determining section. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27)
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Specification