SYSTEM, METHOD, AND PRODUCT FOR GENERATING PATTERNED ILLUMINATION
First Claim
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1. A method for generating an interference pattern at a probe array, comprising:
- directing a light at a first waveguide and second waveguide, wherein the light travels along an optical path, wherein the first and second waveguides are positioned adjacent to each other and the output from the first and second waveguides produce an orientation of an interference pattern;
rotating at least one waveguide about an axis relative to the optical path to alter the orientation of the interference pattern; and
directing the interference pattern at the probe array.
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Abstract
An embodiment of a method for generating an interference pattern at a probe array is described that comprises directing light at a first waveguide and second waveguide, wherein the first and second waveguides are positioned adjacent to each other and the output from the first and second waveguides produce an interference pattern; and directing the interference pattern at the probe array.
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Citations
26 Claims
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1. A method for generating an interference pattern at a probe array, comprising:
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directing a light at a first waveguide and second waveguide, wherein the light travels along an optical path, wherein the first and second waveguides are positioned adjacent to each other and the output from the first and second waveguides produce an orientation of an interference pattern; rotating at least one waveguide about an axis relative to the optical path to alter the orientation of the interference pattern; and directing the interference pattern at the probe array. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. The method for generating an interference pattern to interrogate a surface of a support comprising:
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directing light at a first waveguide, wherein the light travels along a first optical path; directing light at a second waveguide, wherein the light travels along a second optical path, wherein the first and second waveguides are positioned in an operative relationship so as to produce an orientation of an interference pattern; rotating at least one waveguide about an axis relative to the optical path to alter the orientation of the interference pattern; directing the interference pattern at a surface of a support; and detecting signals from the surface of the support. - View Dependent Claims (11, 12, 13, 14, 15, 16)
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17. A system to image the surface of a support comprising:
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a source of excitation light; a first waveguide capable of receiving light from the excitation light and transmitting the light out an exit port; a second waveguide capable of receiving light from an excitation light and producing an orientation of an interference pattern when proximately positioned near the first waveguide, the second waveguide is capable of transmitting the light out an exit port; a rotating mechanism, wherein the rotating mechanism rotates at least one waveguide about an axis relative to the optical path to alter the orientation of the interference pattern; a support having probes on a surface of a support facing the exit ports of the first and second waveguides; a detector capable of receiving reflected signals from the surface of the support; and
a processor for analyzing the detected signals. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26)
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Specification