JTAG Mailbox
First Claim
Patent Images
1. An electronic device comprising:
- a processing stage having a JTAG port with a test data input pin (TDI), a test data output pin (TDO), a test mode select pin (TMS) and a test clock pin (TCK);
a test access port (TAP) controller having a data register (DR) shift state and an instruction register shift (IR) state; and
wherein said electronic device is operable in a scan event mode to automatically map an incoming event to said TDO pin.
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Abstract
An electronic device comprises a processing stage, a JTAG port including a test data input pin (TDI), a test data output pin (TDO), a test mode select pin (TMS), a test clock pin (TCK), and a test access port (TAP) controller having a data register (DR) shift state and an instruction register shift (IR) state. The electronic device operates in a scan event mode automatically mapped an incoming event to the TDO pin.
23 Citations
13 Claims
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1. An electronic device comprising:
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a processing stage having a JTAG port with a test data input pin (TDI), a test data output pin (TDO), a test mode select pin (TMS) and a test clock pin (TCK); a test access port (TAP) controller having a data register (DR) shift state and an instruction register shift (IR) state; and wherein said electronic device is operable in a scan event mode to automatically map an incoming event to said TDO pin. - View Dependent Claims (2)
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3. An electronic device comprising:
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a processing stage having a JTAG port with a test data input pin (TDI), a test data output pin (TDO), a test mode select pin (TMS) and a test clock pin (TCK), a test access port (TAP) controller having a data register (DR) shift state and an instruction register shift (IR) state; and a first register storing an event for the processing stage received through said TDI pin. - View Dependent Claims (4, 5, 6, 7, 8, 9)
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10. A testing system comprising:
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a first electronic device having a JTAG port and configurable as a master device; a second electronic device having a JTAG port; wherein said first electronic device is coupled to said second electronic device through said JTAG port for testing said second electronic device; and wherein said second electronic device is configured to receive an event automatically transmitted from a TDO pin of said JTAG port.
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12. A method of operating an electronic device having a JTAG port, comprising the steps of:
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sending an instruction to the electronic device via the JTAG port; switching the electronic device into a scan event mode automatically reporting an event through a TDO pin of the JTAG pin in response to the instruction.
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13. A system comprising:
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a plurality of electronic devices each having JTAG ports; wherein said electronic devices are coupled in a daisy chain through respective TDI pins and TDO pins of their respective JTAG ports and the JTAG ports are configured to asynchronously forward events.
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Specification