APPARATUS, SYSTEM, AND METHOD FOR USING MULTI-LEVEL CELL SOLID-STATE STORAGE AS SINGLE-LEVEL CELL SOLID-STATE STORAGE

• US 20100235715A1
• Filed: 03/15/2010
• Published: 09/16/2010
• Est. Priority Date: 03/13/2009
• Status: Active Grant

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: Fusion-IO Incorporated (Western Digital Corporation)
• Inventors: Barnes, Ethan, Flynn, David, Thatcher, Jonathan, Zappe, Michael, Strasser, John, Wood, Robert
• Granted Patent: US 8,261,158 B2
• Time in Patent Office: Days
• US Class Current: 714/763
• CPC Class Codes: G06F 11/1072 in multilevel memories
• CPC Class Codes: G11C 11/5621 using charge storage in a floating gate
• CPC Class Codes: G11C 11/5628 Programming or writing circuits; Data input circuits
• CPC Class Codes: G11C 11/5642 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 16/0483 comprising cells having several storage transistors connected in series
• CPC Class Codes: G11C 16/10 Programming or data input circuits
• CPC Class Codes: G11C 16/26 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 2211/5641 Multilevel memory having cells with different number of storage levels
• CPC Class Codes: G11C 29/00 Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation

Abstract

An apparatus, system, and method are disclosed for storing information in a storage device that includes multi-level memory cells. The method involves storing data that is written to the storage device in the LSBs of the multi-level memory cells, and storing audit data in the MSBs of the multi-level memory cells. The audit data can be read separately from the data and used to determine whether or not there has been any unintended drift between states in the multi-level cells. The audit data may be used to correct data when the errors in the data are too numerous to be corrected using error correction code (ECC). The audit data may also be used to monitor the general health of the storage device. The monitoring process may run as a background process on the storage device. The storage device may transition the multi-level memory cells to operate as single-level memory cells.

Claims

1. A method to store information in a storage device comprising one or more multi-level memory cells, the method comprising:

reading a data bit in a multi-level memory cell in a first read operation;

reading an audit bit in the multi-level memory cell in a second read operation separate from the first read operation;

determining that the audit bit fails to match an expected value for the audit bit; and

determining that a validity of the data bit is suspect in response to the audit bit failing to match an expected value of the audit bit.

2. The method of claim 1, further comprising initiating the second read operation in response to an audit-triggering event.

3. The method of claim 2, wherein the audit-triggering event comprises one or more of:

a read count reaching a read count limit;

a program count reaching a program count limit;

an error rate reaching an error rate limit;

a number of detected data errors reaching an error limit;

a number of operations reaching an operation limit;

a timer reaching a time limit; and

free cycles on the storage device becoming available.

4. The method of claim 2, wherein the audit-triggering event comprises a determination that a number of detected bit errors in an error correcting code (“

ECC”

) chunk that includes the multi-level memory cell exceeds a correctable bit error count.

5. The method of claim 4, further comprising flipping the data bit in the multi-level memory cell in response to determining that the audit bit in the multi-level memory cell does not match the expected value of the audit bit and thereafter rechecking the ECC chunk.

6. The method of claim 1, further comprising tracking a number of times that the audit bit fails to match the expected value of the audit bit.

7. The method of claim 6, further comprising marking the multi-level cell as unreliable in response to the number of times the audit bit fails to match the expected value of the audit bit exceeding a limit.

8. The method of claim 7, further comprising configuring the storage device to use the multi-level memory cell as a single-level memory cell in response to the number of times the audit bit does not match an expected value of the audit bit exceeding the limit.

9. The method of claim 1, wherein a first address of the audit bit in the multi-level memory cell is different from a second address of the data bit in the multi-level memory cell.

10. The method of claim 9, wherein a delay of programming the audit bit is at least five times greater than a delay of programming the data bit, the method further comprising writing data exclusively to the data bit.

11. The method of claim 1, further comprising reading the data bit and the audit bit of the multi-level cell in a single operation.

12. The method of claim 1, wherein reading the audit bit in the second read operation occurs as part of a background process of the storage device.

13. An apparatus to store information in a storage device comprising one or more multi-level memory cells, the apparatus comprising instructions to execute the following:

receiving a write command from a client, the write command comprising a logical block address;

mapping the logical block address received from the client to one or more page pairs of the storage device, wherein each page pair comprises a lower page associated with a least significant bit (LSB) of a plurality of multi-level cells in the storage device, and an upper page associated with a most significant bit (MSB) of the multi-level cells;

setting a physical address for storing data associated with the write command to the physical address for the lower pages of the one or more page pairs; and

writing data associated with the write command received from the client to only one of the pages in each page pair of the one or more page pairs.

14. The apparatus of claim 13, further comprising validating data in the lower page using audit data from the upper page.

15. The apparatus of claim 13, further comprising storing audit data for the lower page in the upper page of the page pair.

16. The apparatus of claim 14, further comprising searching for bit errors in the data stored in a lower page in response to determining that a number of detected bit errors in an error correcting code (“

ECC”

) chunk for the lower page exceeds a correctable bit error count.

17. The apparatus of claim 16, wherein searching for bit errors in the data stored in the lower page further comprises searching the audit data in an upper page paired to the lower page and determining that the lower page comprises suspect data bits in response to corresponding bits in the upper page not matching an expected value.

18. The apparatus of claim 13, further comprising flipping one or more bits in the lower page corresponding to bits in the upper page that do not match the expected value.

19. The apparatus of claim 13, wherein one or more hardware controllers that program the multi-level memory cells employ a two-phase programming model for paired pages.

20. The apparatus of claim 19, further comprising increasing a guard band between two data states in the multi-level cells of the storage device by executing a first program phase to put the cell in an intermediate state, followed by a second program phase to put the cell in a final state.

21. The apparatus of claim 13, wherein setting a physical address for storing data associated with the write command further comprises setting the physical page for storing data to the upper page, in response to determining that reliability of storing data in the lower page has decreased below a threshold.

22. A system for storing information in a storage device comprising one or more multi-level memory cells, the system comprising:

a driver configured to receive a write command from a client, the write command comprising a logical block address;

a mapping logic module configured to map the logical block address received from the client to one or more page pairs of the storage device, wherein each page pair comprises a lower page associated with a least significant bit (LSB) of a plurality of multi-level cells in the storage device, and an upper page associated with a most significant bit (MSB) of the multi-level cells;

the mapping logic further configured to set a physical address for storing data associated with the write command to the physical address for the lower pages of the page pair; and

a hardware controller configured to write data associated with the write command received from the client to the physical address supplied by the mapping logic module.

23. The system of claim 22, wherein the multi-level memory cells store n bits per storage cell by way of 2ⁿ progressively increasing voltage states, and wherein n bits of the multi-level memory cells are organized into page tuples in which each bit of the multi-level memory cell is addressable in a distinct page of the page tuple.

24. The system of claim 22, wherein n equals 2 and the page tuple comprises a page pair in which the lowest page of the page pair corresponds to voltage states that are less than the maximum voltage state for the multi-level memory cells.

25. The system of claim 24, wherein the multi-level memory cells support four progressively increasing voltage states, and wherein the lower pages correspond to the first and third voltage states.