IMAGING DEVICES AND METHODS FOR CHARGE TRANSFER

• US 20100243866A1
• Filed: 03/26/2009
• Published: 09/30/2010
• Est. Priority Date: 03/26/2009
• Status: Active Grant

• Current Assignee: Aptina Imaging Corporation (ON Semiconductor Corporation)
• Original Assignee: Aptina Imaging Corporation (ON Semiconductor Corporation)
• Inventors: Mo, Yaowu, Xu, Chen
• Granted Patent: US 8,324,548 B2
• Time in Patent Office: Days
• US Class Current: 250/214.A
• CPC Class Codes: H03F 3/08 controlled by light

Abstract

A pixel circuit having improved charge transfer including an amplifier having an input node electrically connected to a charge storage node of the pixel circuit, and a negative feedback control loop having a capacitance element electrically connected between the input node and an output node of said amplifier.

Claims

1. A pixel circuit comprising:

at least one pixel including a photosensor and a transfer transistor;

a charge storage node configured to be electrically connected to said photosensor when said transfer transistor is activated;

an amplifier having an input node and an output node, the input node electrically connected to said charge storage node; and

a feedback loop electrically connected between said input node and said output node of said amplifier, said feedback loop comprising a capacitance element and a reset transistor electrically connected in parallel to said capacitance element during operation of said pixel.

2. The pixel circuit of claim 1, wherein said reset transistor is configured to receive a reset control signal and said transfer transistor is configured to receive a transfer control signal from a control circuit, and

wherein said control circuit is configured to deactivate said reset transistor and activate said transfer transistor to form a capacitance divider between said capacitance element and said photosensor.

3. The pixel circuit of claim 2, wherein said capacitance divider fixes a voltage of said floating diffusion node at a substantially constant voltage.

4. The pixel circuit of claim 1, wherein said amplifier is a common-source amplifier comprising a transistor with a gate electrically connected to said floating diffusion node, and a drain connected to a column current sink and said negative feedback control loop.

5. The pixel circuit of claim 1, further comprising a row select transistor configured to receive a row select control signal and electrically connect said capacitance element to an output column line.

6. The pixel circuit of claim 5, wherein said row select transistor is connected within said feedback loop between said drain and said reset transistor.

7. The pixel circuit of claim 6, wherein said row select control voltage is biased at a voltage level sufficient to operate said row select transistor as a cascode buffer for said amplifier.

8. The pixel circuit of claim 5, wherein said row select transistor is connected outside said feedback loop to said drain and said column line.

9. The pixel circuit of claim 4, wherein said amplifier is biased by said current sink.

10. The pixel circuit of claim 1, wherein said capacitance element is a capacitor.

11. The pixel circuit of claim 1, wherein said capacitance element is a parasitic capacitance between said input node and said output node of said amplifier.

12. The pixel circuit of claim 4, wherein said capacitance element is a parasitic capacitance between said drain and said gate of said common-source amplifier.

13. The pixel circuit of claim 1, wherein said capacitance element has a capacitance within a range of approximately 1 femtoFarad to approximately 3 femtoFarads.

14. The pixel circuit of claim 1, wherein said amplifier comprises a common source amplifier comprising a transistor with a gate connected to said charge storage region, a source connected to a ground potential, and a drain connected to said capacitance element, wherein said common source amplifier is biased by a current sink,

said pixel circuit further comprising a row select transistor electrically connected in said feedback loop between said capacitance element and said reset transistor, and

wherein a control circuit is configured to deactivate said reset transistor and activate said transfer transistor to form a capacitance divider between said capacitance element and said photosensor.

15. A method of operating a pixel cell having a pixel circuit, said method comprising:

resetting said pixel circuit by activating a reset transistor of said pixel circuit, said pixel circuit further comprising at least one photosensor, a charge storage node, an amplifier having an input connected to said charge storage node, and a capacitance element in a feedback loop of said amplifier; and

amplifying a pixel signal of said pixel circuit by;

deactivating said reset transistor,

electrically connecting said at least one photosensor to said capacitance element and said floating diffusion node by activating said transfer transistor to form a capacitance divider between said at least one photosensor and said capacitance element, and

amplifying a signal provided at an input of said amplifier to produce a pixel signal.

16. The method of claim 15, wherein said signal provided at said input of said amplifier is a net current generated by a potential difference between said floating diffusion node and said photosensor, and

wherein amplifying said signal to produce said pixel signal further comprises integrating said net current at said capacitance element.

17. The method of claim 15, further comprising activating said reset transistor and said transfer transistor to reset said photosensor during a shutter phase.

18. The method of claim 15, further comprising activating a row select transistor electrically connecting an output of said amplifier to said reset transistor and to sample-and-hold circuitry prior to activating said reset transistor.

19. The method of claim 18, further comprising biasing a control signal of said row select transistor such that said row select transistor acts as a cascode amplifier to said amplifier.

20. An imager comprising:

a pixel array having a plurality of pixels, each of said pixels including at least one pair of a transfer transistor and a photosensor, said pixel array comprising;

a circuit configured to output a pixel signal from at least one of said pixels, said circuit comprising;

a charge storage node connected to said transfer transistor of said pixel;

an amplifier having an input node and an output node, wherein the input node is electrically connected to said charge storage node; and

a feedback loop electrically connected between said input node and said output node of said amplifier, said feedback loop comprising a capacitance element and a reset transistor electrically connected in parallel to said capacitance element during operation of said pixel; and

sample-and-hold circuitry for sampling a reset voltage and an output voltage from said circuit.

21. The imager of claim 20, wherein said circuit further comprises a row select transistor configured to receive a row select control voltage and output a voltage from said circuit to said sample-and-hold circuitry.

22. The imager of claim 21, further comprising a control circuit configured to deactivate said reset transistor and activate at least one transfer transistor to form a capacitance divider between said capacitance element and said photosensor corresponding to said at least one activated transfer transistor.

23. The imager of claim 22, wherein said circuit is configured to output pixel signals from a plurality of pixels in said pixel array to said sample-and-hold circuitry via a column line.

24. The imager of claim 23, wherein said control circuit is configured to activate transfer transistors of each of said plurality of pixels substantially simultaneously.

25. The imager of claim 23, wherein said control circuit is configured to activate transfer transistors of each of said plurality of pixels at different times.

26. The imager of claim 22, wherein said row select transistor is located within said negative feedback control loop, and said row select control voltage is biased at a voltage level sufficient to operate said row select transistor as a cascode buffer for said amplifier.

27. The imager of claim 21, wherein said row select transistor is located outside of said negative feedback control loop.

28. The imager of claim 20, wherein said imager is part of a camera system.