APPARATUS AND METHODS RELATING TO ENHANCED SPECTRAL MEASUREMENT SYSTEMS
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Abstract
The apparatus and methods herein provide light sources and spectral measurement systems that can improve the quality of images and the ability of users to distinguish desired features when making spectroscopy measurements by providing methods and apparatus that can improve the dynamic range of data from spectral measurement systems.
109 Citations
41 Claims
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1-23. -23. (canceled)
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24. A method for measuring spectral properties of a target material, the method comprising:
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generating an illumination light containing a desired variable spectral output and desired variable wavelength dependent intensity distribution from a computer-controlled illumination system comprising a tunable light source configured to emit the illumination light and a controller operably connected to the tunable light source and configured to vary the desired spectral output and desired wavelength dependent intensity distribution of the illumination light to provide the desired spectral output and desired wavelength dependent intensity distribution ; directing the illumination light toward the target material; sensing the light from the target with a spectral measurement sensor; determining target spectral data that represents at least a spectral distribution and wavelength dependent intensity distribution of light emanating from the target material; and transmitting the target spectral data to the controller, wherein the controller receives the target spectral data and incorporates the target spectral data to tune the tunable light source. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39)
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40. A method for generating target material reference spectral data, the method comprising:
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obtaining target material reference spectral data for a plurality of target materials using illumination light from a tunable light source configured to emit illumination light having specific variable selected spectral output and specific variable selected wavelength dependent intensity distribution; recording the target material reference spectral data for each of the plurality of target materials and recording the specific illumination light corresponding to each target material spectral data obtained. - View Dependent Claims (41)
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Specification