Method And Apparatus For Determining The Emissivity, Area And Temperature Of An Object
First Claim
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1. A method of determining emissivity, temperature and area of an object, the method comprising:
- simulating a measure of a radiant intensity of the object at each of a first wavelength, a second wavelength and a third wavelength;
forming a plurality of ratios of the measures of radiant intensity of the object, wherein each ratio is based upon a relationship of the measure of radiant intensity of the object at one wavelength to the measure of radiant intensity of the object at another wavelength;
determining the emissivity of the object as a function of the temperature of the object for each of a plurality of the ratios;
determining the area of the object as a function of the temperature of the object for each of a plurality of the ratios based upon the emissivity of the object as determined for a respective ratio and the measure of radiant intensity of the object at a wavelength other than the wavelengths associated with the respective ratio; and
determining the temperature of the object based upon the measure of radiant intensity of the object at each of the first, second and third wavelengths and the emissivity and the area of the object as determined as a function of the temperature of the object.
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Abstract
Methods and apparatus are provided to determine the emissivity, temperature and area of an object. The methods and apparatus are designed such that the emissivity and area of the object may be separately determined as functions dependent upon the temperature of the object derived from a three or more band infrared measurement sensor. As such, the methods and apparatus may only require a regression analysis of the temperature of the object without any regression analysis of the emissivity and area of the object.
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20 Claims
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1. A method of determining emissivity, temperature and area of an object, the method comprising:
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simulating a measure of a radiant intensity of the object at each of a first wavelength, a second wavelength and a third wavelength; forming a plurality of ratios of the measures of radiant intensity of the object, wherein each ratio is based upon a relationship of the measure of radiant intensity of the object at one wavelength to the measure of radiant intensity of the object at another wavelength; determining the emissivity of the object as a function of the temperature of the object for each of a plurality of the ratios; determining the area of the object as a function of the temperature of the object for each of a plurality of the ratios based upon the emissivity of the object as determined for a respective ratio and the measure of radiant intensity of the object at a wavelength other than the wavelengths associated with the respective ratio; and determining the temperature of the object based upon the measure of radiant intensity of the object at each of the first, second and third wavelengths and the emissivity and the area of the object as determined as a function of the temperature of the object. - View Dependent Claims (2, 3, 4, 5, 6, 11, 12)
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7. A method of determining emissivity, temperature and area of an object, the method comprising:
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simulating a measure of a radiant intensity of the object at each of a plurality of wavelengths; determining the emissivity and the area of the object as respective functions of the temperature of the object; and performing a regression analysis of the temperature of the object without separately performing a regression analysis of the emissivity and the area of the object, wherein performing the regression analysis of the temperature of the object determines the temperature of the object from which the emissivity and the area of the object are determinable. - View Dependent Claims (8, 9, 10, 13)
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- 14. An apparatus for determining emissivity, temperature and area of an object, the apparatus comprising a processor configured to simulate a measure of a radiant intensity of the object at each of a first wavelength, a second wavelength and a third wavelength, the processor also configured to determine the emissivity and the area of the object as respective functions of the temperature of the object, and the processor further configured to perform a regression analysis of the temperature of the object without separately performing a regression analysis of the emissivity and the area of the object, wherein the processor, in the performance of the regression analysis of the temperature of the object, is configured to determine the temperature of the object from which the emissivity and the area of the object are determinable.
Specification