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Testing an inductive load of a device using a modulated signal

  • US 20100259274A1
  • Filed: 05/31/2007
  • Published: 10/14/2010
  • Est. Priority Date: 05/31/2007
  • Status: Active Grant
First Claim
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1. A method for testing an inductive load of a device, the method comprising:

  • effectuating application of a modulated test signal to the inductive load of the device;

    obtaining a result signal in response to the application of the modulated test signal to the inductive load of the device; and

    based on the result signal, generating an output signal indicating that the inductive load of the device is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state.

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