Testing an inductive load of a device using a modulated signal
First Claim
1. A method for testing an inductive load of a device, the method comprising:
- effectuating application of a modulated test signal to the inductive load of the device;
obtaining a result signal in response to the application of the modulated test signal to the inductive load of the device; and
based on the result signal, generating an output signal indicating that the inductive load of the device is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state.
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Accused Products
Abstract
A device has built-in inductive load testing capabilities. The device includes a device housing, an inductive load disposed within the device housing; and test circuitry disposed within the device housing. The test circuitry is constructed and arranged to effectuate application of a modulated test signal to the inductive load, and obtain a result signal in response to the application of the modulated test signal to the inductive load. The test circuitry is further constructed and arranged to generate an output signal indicating that the inductive load is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state, based on the result signal. Such test circuitry is well-suited for testing a variety of devices having inductors/coils which are susceptible to defects (e.g., a solenoid, a motor winding, various actuator components, etc.).
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Citations
20 Claims
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1. A method for testing an inductive load of a device, the method comprising:
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effectuating application of a modulated test signal to the inductive load of the device; obtaining a result signal in response to the application of the modulated test signal to the inductive load of the device; and based on the result signal, generating an output signal indicating that the inductive load of the device is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state. - View Dependent Claims (2, 3, 4)
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5. A device, comprising:
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a device housing; an inductive load disposed within the device housing; test circuitry disposed within the device housing, the test circuitry being constructed and arranged to; effectuate application of a modulated test signal to the inductive load, obtain a result signal in response to the application of the modulated test signal to the inductive load, and generate an output signal indicating that the inductive load is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state, based on the result signal. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12)
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13. A guidable projectile deployment system, comprising:
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a support platform; a command interface supported by the support platform; and a guidable projectile supported by the support platform, the guidable projectile having a housing, an inductive load disposed within the housing, and test circuitry disposed within the housing, the test circuitry being constructed and arranged to; effectuate application of a modulated test signal to the inductive load in response to a command from the command interface, obtain a result signal in response to the application of the modulated test signal to the inductive load, and generate an output signal and provide the output signal to the command interface, the output signal indicating that the inductive load is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state, based on the result signal. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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Specification