Analyte Testing Systems
First Claim
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1. An analyte measurement system comprising:
- a meter; and
one or more cartridges of analyte testing devices, each cartridge comprising an integrated circuit coupled thereto and having stored thereon information specific to the analyte testing devices within the cartridge, and wherein the meter is configured to communicate with the integrated circuit to access the information stored therein, and wherein the system is configured to track at least one analyte testing device degradation parameter.
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Abstract
The present invention includes analyte measurement systems, analyte measurement meters, analyte testing devices, cartridges thereof and integrated circuits for use therewith, and further includes methods related to the use of the integrated circuits and, in certain embodiments, to the counting or tracking of parameters related to the cartridges and analyte test devices.
42 Citations
54 Claims
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1. An analyte measurement system comprising:
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a meter; and one or more cartridges of analyte testing devices, each cartridge comprising an integrated circuit coupled thereto and having stored thereon information specific to the analyte testing devices within the cartridge, and wherein the meter is configured to communicate with the integrated circuit to access the information stored therein, and wherein the system is configured to track at least one analyte testing device degradation parameter. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. An integrated circuit configured for coupling to a cartridge containing a plurality of analyte testing devices, the integrated circuit comprising:
at least one algorithm for tracking at least one analyte testing device degradation parameter. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40)
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41. A method of tracking at least one degradation parameter for analyte testing devices dispensable from within a sealed cartridge having an integrated circuit coupled thereto and installable within an analyte measurement meter communicable therewith, the method, upon installation of the cartridge within the meter, comprising:
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communicating with the integrated circuit and accessing the at least one degradation parameter; and updating the at least one degradation parameter based on at least one type of action performed by the meter. - View Dependent Claims (44, 45, 46, 47, 48, 49, 50)
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42. The method of 41, wherein:
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a first degradation parameter comprises cumulative time the analyte testing devices are exposed to ambient air; and a first type of action comprises temporarily unsealing the cartridge.
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43. The method of 42, wherein:
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a second degradation parameter comprises cumulative time the analyte testing devices are exposed to desiccated conditions, wherein the cartridge comprises a desiccating material; and a second type of action comprises receiving the cartridge in the meter.
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51. A method of analyte testing calibration for a lot of analyte testing devices contained within a cartridge configured for installation into an analyte testing meter, the method comprising:
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storing information specific to the lot of analyte testing devices onto an integrated circuit associated with the cartridge, the information including a cartridge identifier; installing the cartridge into the meter, wherein the meter is in communication with the integrated circuit; storing the cartridge identifier onto the meter from the integrated circuit; and calibrating the meter for using the analyte testing devices associated with the cartridge identifier. - View Dependent Claims (52, 53, 54)
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Specification