Soft Error Hard Electronic Circuit and Layout
First Claim
1. A sequential logic cell (also referred to as a latch), comprising four inverter circuits, each inverter comprising at least one p-type MOSFET and at least one n-type MOSFET, where the inverter have been connected as a Dual Interlocked Cell (DICE), the cell having four nets (numbered 1,2,3,4), each net connected to one inverter output and to two gates, such that the n'"'"'th net is connected to the output of the n'"'"'th inverter, to gate of the p-type MOSFET of the (n+1)'"'"'th inverter, and to the n-type MOSFET gate of the (n−
- 1)'"'"'th inverter, in a cyclic manner (such that when n=0, then n−
1 refers to the 4'"'"'th net, and when n=4 then n+1 refers to the first net), nets 1 and 3 carrying the same voltage state and net 2 and 4 carrying the inverse of the voltage state of net 1 and 3, each net having one p-type drain contact area (denoted p1, p2, p3, p4) and one n-type drain contact area (denoted n1, n2, n3, n4), these contact areas being the original drain contact areas, the MOSFETs of these contact areas being the original 8 MOSFETs, and the DICE circuit cell formed by these MOSFETs the original circuit cell, comprising;
a) an arrangement where the contact areas of each of the four nets, are placed along a line in the layout, andb) the drain contact areas are placed along the line in the layout in any of the following orders;
n3, n4, p4, p1, n1, n2, p2, p3n4, n3, p4, p3, n2, n1, p2, p1n2, n3, p4, p3, n2, n1, p2, p1n4, n1, n3, n2, p3, p2, p1, p4n1, n4, n3, n2, p2, p3, p4, p1n1, n4, n3, n2, p4, p3, p2, p1n4, p4, n3, p3, n2, p2, n1, p1and any order that can be derived naturally from these configuration, under consideration of the circuit symmetry, including cyclic permutations, or an interchange of the following drain contact area pairs [n1, n3], [n2, n4], [p1, p3], and [p2, p4].
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Accused Products
Abstract
This invention comprises a layout method to effectively protect electronic circuits against soft errors (non-destructive errors) and circuit cells, which are protected against soft errors. The invention applies a layout method to sequential and combinational logic to generate specific circuit cells with netlists and layouts which are hardened against single event generated soft-errors. It also devices methods of how two or more such cells should be laid out and placed relative to each other, in order to have the best global soft-error protection.
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Citations
15 Claims
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1. A sequential logic cell (also referred to as a latch), comprising four inverter circuits, each inverter comprising at least one p-type MOSFET and at least one n-type MOSFET, where the inverter have been connected as a Dual Interlocked Cell (DICE), the cell having four nets (numbered 1,2,3,4), each net connected to one inverter output and to two gates, such that the n'"'"'th net is connected to the output of the n'"'"'th inverter, to gate of the p-type MOSFET of the (n+1)'"'"'th inverter, and to the n-type MOSFET gate of the (n−
- 1)'"'"'th inverter, in a cyclic manner (such that when n=0, then n−
1 refers to the 4'"'"'th net, and when n=4 then n+1 refers to the first net), nets 1 and 3 carrying the same voltage state and net 2 and 4 carrying the inverse of the voltage state of net 1 and 3, each net having one p-type drain contact area (denoted p1, p2, p3, p4) and one n-type drain contact area (denoted n1, n2, n3, n4), these contact areas being the original drain contact areas, the MOSFETs of these contact areas being the original 8 MOSFETs, and the DICE circuit cell formed by these MOSFETs the original circuit cell, comprising;a) an arrangement where the contact areas of each of the four nets, are placed along a line in the layout, and b) the drain contact areas are placed along the line in the layout in any of the following orders; n3, n4, p4, p1, n1, n2, p2, p3 n4, n3, p4, p3, n2, n1, p2, p1 n2, n3, p4, p3, n2, n1, p2, p1 n4, n1, n3, n2, p3, p2, p1, p4 n1, n4, n3, n2, p2, p3, p4, p1 n1, n4, n3, n2, p4, p3, p2, p1 n4, p4, n3, p3, n2, p2, n1, p1 and any order that can be derived naturally from these configuration, under consideration of the circuit symmetry, including cyclic permutations, or an interchange of the following drain contact area pairs [n1, n3], [n2, n4], [p1, p3], and [p2, p4]. - View Dependent Claims (2, 3, 4, 5, 6, 7, 11, 12, 14)
- 1)'"'"'th inverter, in a cyclic manner (such that when n=0, then n−
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8. A duplicated combinational circuit wherein the circuit carries a primary and a redundant copy of the data signal, the redundant signal being the inverse of the primary signal, and where each logic gate consists of a regular logic gate, operating on the primary signal, and of an inverse logic gate, being the inverse of the regular logic gate, operating on the redundant (inverse) signal, said inverse logic gate, having the function provided by inverting every signal in the truth-table for the regular logic gate, comprising:
a) a layout arrangement wherein the combined regular and inverse logic gate is laid out such that there is no straight line between two contact areas in the layout, for which a single event have the same effect on the state of the circuit, unless there is another contact area in between the first two contact areas, for which a single event has the opposite effect on the state of the circuit, i.e., if a single event affecting a first contact area has the effect of creating an error on the primary signal, and a single event on a second node has the effect of creating an error on the redundant (inverse signal), then one, or more, third contact areas, for which a single event has the opposite effect of the that on the first or second contact areas, should be placed in between said first and second contact areas. - View Dependent Claims (9)
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10. A duplicated combinational circuit, compromising two inter-coupled c-elements, wherein one of the inputs of the first c-element is connected to a logic data input signal, and one of the inputs of the other c-element is connected to the inverse of said data signal, and the output of each c-element is connected to one of the inputs of the other c-element, comprising:
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a) a layout arrangement where all the contact areas which are connected to nodes in the circuit element, are placed along a line in the layout; and b) if px is the drain of the p-type MOSFET, and nx is the drain of the n-type MOSFET drain, which is connected to output node x, and the adjacent nodes in the schematic are ordered 0,1, the nodes along the line are ordered such that two nodes, for which a single event has the same effect on the circuit state, are always separated by another node that has the opposite effect on the circuit state. This includes the following node orders;
[p0, p1, n1, n0], as well as any cyclic permutation of this order, and any order where the following nodes are interchanged;
odd n-type, even n-type, odd p-type, odd n-type pairs. - View Dependent Claims (13)
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15. A method for laying out an electronic circuit, comprising:
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a) an arrangement where for some, first, n-type contact areas, a second n-type MOSFET is added next to said contact area, whereby the first drain contact area forms the drain contact area of the second MOSFET, and the source contact area of the second MOSFET is connected to the high power (VDD), and the gate of the second MOSFET is always connected to the low power (VSS); and b) an arrangement where for some, first, p-type contact areas, a second p-type MOSFET is added next to said contact area, whereby the first drain contact area forms the drain contact area of the second MOSFET, and the source contact area of the second MOSFET is connected to the low power (VSS), and the gate of the second MOSFET is always connected to the high power (VDD).
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Specification