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SEMICONDUCTOR TEST SYSTEM AND METHOD

  • US 20100277196A1
  • Filed: 05/01/2009
  • Published: 11/04/2010
  • Est. Priority Date: 05/01/2009
  • Status: Active Grant
First Claim
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1. A method of testing semiconductor devices, the method comprising the steps of:

  • (a) making a first set of electrical connections to a first set of devices to allow a first set of tests to be performed on that set of devices and concurrently making a second set of electrical connections to a second set of devices to allow a second set of tests to be performed on the second set of devices, wherein the first and second sets of tests are different; and

    (b) concurrently performing the first set of tests on the first set of devices and the second set of tests on the second set of devices.

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