CAPACITIVE SENSING USER INTERFACES AND IMPLEMENTATION THEREOF

• US 20100277351A1
• Filed: 12/13/2007
• Published: 11/04/2010
• Est. Priority Date: 12/13/2007
• Status: Active Grant

• Current Assignee: Kyocera Corporation
• Original Assignee: Kyocera Corporation
• Inventors: THOMA, Jeffrey M., TAYLOR, John P.
• Granted Patent: US 8,072,356 B2
• Time in Patent Office: Days
• US Class Current: 341/33
• CPC Class Codes: H03K 17/9622 using a plurality of detectors, e.g. keyboard
• CPC Class Codes: H03K 2217/960705 Safety of capacitive touch and proximity switches, e.g. increasing reliability, fail-safe
• CPC Class Codes: H03K 2217/960715 Rc-timing; e.g. measurement of variation of charge time or discharge time of the sensor
• CPC Class Codes: H03K 2217/960765 Details of shielding arrangements

Abstract

Methods and apparatus for determining the operating states of a plurality of capacitive sensing buttons in a capacitive sensing user interface are disclosed. The capacitive sensing buttons are sampled in a round-robin fashion such that the decay time samples for the buttons are acquired in an interleaved manner during each sampling cycle. Provisions are made to reduce the initialization delay, to reduce transient-induced errors, and to obtain the operating states based on updated decay data samples for the buttons.

Claims

1. In an electronic device, a method for determining operating states of a plurality of capacitive sensing elements, said plurality of capacitive-sensing elements including at least a first capacitive sensing element and a second capacitive sensing element, said first capacitive sensing element having an associated first steady-state number of decay time samples employed for determining an operating state of said first capacitive sensing element during steady-state operation, said second capacitive sensing element having an associated second steady-state number of decay time samples employed for determining an operating state of said second capacitive sensing element during said steady-state operation, comprising:

acquiring, in an interleaved manner, a first plurality of decay time samples for said first capacitive sensing element and said second capacitive sensing element, wherein a maximum consecutive number of decay time samples acquired for said first capacitive sensing element in said first plurality of decay time samples is less than said first steady-state number of decay time samples and wherein a maximum consecutive number of decay time samples acquired for said second capacitive sensing element in said first plurality of decay time samples is less than said second steady-state number of decay time samples; and

determining said operating state of said first capacitive sensing element using at least decay time samples acquired for said first capacitive sensing element in said first plurality of decay time samples, wherein said operating state of said first capacitive sensing element affects an operating characteristic of at least one function of said electronic device.

2. The method of claim 1 wherein said determining said operating state of said first capacitive sensing element includes computing a first error-mitigated decay time sample that factors in at least said decay time samples acquired for said first capacitive sensing element in said first plurality of decay time samples.

3. The method of claim 1 wherein said determining said operating state for said first capacitive sensing element occurs before a number of said decay time samples acquired for said first capacitive sensing element in said first plurality of decay time samples equals or exceeds said first steady-state number of decay time samples.

4. The method of claim 1 wherein said determining said operating state for said first capacitive sensing element occurs after a number of said decay time samples acquired for said first capacitive sensing element in said first plurality of decay time samples at least equals said first steady-state number of decay time samples.

5. In an electronic device, a method for determining operating states of a plurality of capacitive sensing elements, said plurality of capacitive-sensing elements including at least a first capacitive sensing element and a second capacitive sensing element, an operating state of said first capacitive sensing element being determined based on a first steady-state number of decay time samples acquired for said first capacitive sensing element, an operating state of said second capacitive sensing element being determined based on a second steady-state number of decay time samples acquired for said second capacitive sensing element, comprising:

a) acquiring, in a first sampling cycle, a first number of decay time samples for said first capacitive sensing element and a second number of decay time samples for said second capacitive sensing element, wherein said first number of decay time samples is less than said first steady-state number of decay time samples, and said second number of decay time samples is less than said second steady-state number of decay time samples;

b) acquiring, in a second sampling cycle, a third number of decay time samples for said first capacitive sensing element and a fourth number of decay time samples for said second capacitive sensing element, wherein said third number of decay time samples is less than said first steady-state number of decay time samples, and said fourth number of decay time samples is less than said second steady-state number of decay time samples;

c) computing a first error-mitigated decay time sample value based at least on decay time samples acquired in said first number of decay time samples and in said third number of decay time samples; and

d) determining said operating state of said first capacitive sensing element based on said first error-mitigated decay time sample, wherein said operating state of said first capacitive sensing element affects an operating characteristic of at least one function of said electronic device, wherein said steps c) and d) are performed only after a number of decay time samples actually acquired for said first capacitive sensing element at least equals to said first steady-state number of decay time samples

6. The method of claim 5 wherein said computing said first error-mitigated decay time sample includes performing an average operation that factors in at least said decay time samples acquired in said first number of decay time samples and in said third number of decay time samples.

7. The method of claim 5 wherein said first number of decay time samples is one.

8. The method of claim 7 wherein said second number of decay time samples is one.

9. The method of claim 5 wherein said decay time samples actually acquired for said capacitive sensing element are tracked in a rolling array, at least one decay time sample newly acquired for said first capacitive sensing element replacing at least one old decay time sample stored in said rolling array during each sampling cycle.

10. The method of claim 5 wherein said electronic device is a cellular handset and said first capacitive sensing element implements a button on said cellular handset.

11. The method of claim 5 wherein said operating states represent on/off states.

12. In an electronic device, a method for determining operating states of a plurality of capacitive sensing elements, said plurality of capacitive-sensing elements including at least a first capacitive sensing element and a second capacitive sensing element, said first capacitive sensing element having an associated first steady-state number of decay time samples employed for determining an operating state of said first capacitive sensing element during steady-state operation, said second capacitive sensing element having an associated second steady-state number of decay time samples employed for determining an operating state of said second capacitive sensing element during said steady-state operation, comprising:

a) acquiring, in a first sampling cycle, a first number of decay time samples for said first capacitive sensing element and a second number of decay time samples for said second capacitive sensing element, wherein said first number of decay time samples is less than said first steady-state number of decay time samples, and said second number of decay time samples is less than said second steady-state number of decay time samples;

b) acquiring, in a second sampling cycle, a third number of decay time samples for said first capacitive sensing element and a fourth number of decay time samples for said second capacitive sensing element, wherein said third number of decay time samples is less than said first steady-state number of decay time samples, and said fourth number of decay time samples is less than said second steady-state number of decay time samples;

c) computing a first error-mitigated decay time sample value based at least on decay time samples acquired in said first number of decay time samples and in said third number of decay time samples; and

d) determining said operating state of said first capacitive sensing element based on said first error-mitigated decay time sample, wherein said operating state of said first capacitive sensing element affects an operating characteristic of at least one function of said electronic device.

13. The method of claim 12 wherein said computing said first error-mitigated decay time sample includes performing an average operation that factors in at least said decay time samples acquired in said first number of decay time samples and in said third number of decay time samples.

14. The method of claim 12 wherein said first number of decay time samples is one.

15. The method of claim 14 wherein said second number of decay time samples is one.

16. The method of claim 12 further comprising obtaining decay time samples for said first capacitive sensing element in at least one additional sampling cycle, wherein said step c) and d) are performed only after a number of decay time samples actually acquired for said first capacitive sensing element at least equals to said first steady-state number of decay time samples.

17. The method of claim 12 wherein said decay time samples actually acquired for said capacitive sensing element are tracked in a rolling data structure, at least one decay time sample newly acquired for said first capacitive sensing element replacing at least one old decay time sample stored in said rolling array during each sampling cycle.

18. The method of claim 12 wherein said electronic device is a cellular handset and said first capacitive sensing element implements a button on said cellular handset.

19. The method of claim 12 wherein said steps c) and d) are performed even before a number of decay time samples actually acquired for said first capacitive sensing element equals said first steady-state number of decay time samples.

20. The method of claim 12 wherein said operating states represent on/off states.