SYSTEM AND METHOD FOR INCLUDING PROTECTIVE VOLTAGE SWITCHABLE DIELECTRIC MATERIAL IN THE DESIGN OR SIMULATION OF SUBSTRATE DEVICES
First Claim
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1. A method for optimizing application of voltage switchable dielectric material (VSD) on a substrate device, the method being performed by one or more processors that perform steps comprising:
- identifying one or more criteria for handling a transient electrical event on the substrate device;
identifying one or more optimization criteria for integrating the layer of VSD material onto at least the portion of the substrate; and
optimizing the layer of VSD material based on the one or more optimization criteria.
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Abstract
A substrate device is designed by identifying one or more criteria for handling of a transient electrical event on the substrate device. The one or more criteria may be based at least in part on an input provided from a designer. From the one or more criteria, one or more characteristics may be determined for integrating VSD material as a layer within or on at least a portion of the substrate device. The layer of VSD material may be positioned to protect one or more components of the substrate from the transient electrical condition.
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Citations
10 Claims
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1. A method for optimizing application of voltage switchable dielectric material (VSD) on a substrate device, the method being performed by one or more processors that perform steps comprising:
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identifying one or more criteria for handling a transient electrical event on the substrate device; identifying one or more optimization criteria for integrating the layer of VSD material onto at least the portion of the substrate; and optimizing the layer of VSD material based on the one or more optimization criteria. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification