OPTICAL CYTOMETRY
First Claim
Patent Images
1. A system for obtaining an image of a cell comprising:
- (a) a microscope capable of measuring a feature of interest in a sample.(b) a detector operatively coupled to the microscope;
(c) a sample assembly comprising an observation chamber adapted to contain the cell; and
(d) a plurality of reflective microparticles capable of adhering to the cell, wherein the average diameter of the reflective microparticles is between 0.5 μ
m and 30 μ
m.
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Accused Products
Abstract
The present invention provides optical systems and methods for determining a characteristic of a cell, such as cell type, cellular response to a biochemical event, biological state and the like. The methods typically involve using interferometry to observe membrane properties in a cell and then use this information to determine one or more characteristics of a cell. The methods of the invention are useful for applications such as drug screening as well as diagnostic techniques.
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Citations
38 Claims
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1. A system for obtaining an image of a cell comprising:
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(a) a microscope capable of measuring a feature of interest in a sample. (b) a detector operatively coupled to the microscope; (c) a sample assembly comprising an observation chamber adapted to contain the cell; and (d) a plurality of reflective microparticles capable of adhering to the cell, wherein the average diameter of the reflective microparticles is between 0.5 μ
m and 30 μ
m. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method for observing a property of a cell, the method comprising:
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(a) adhering a reflective magnetic microparticle to the cell; (b) placing the cell in a cell observation chamber of a microscope; (c) exposing the cell coated with the microparticle to a magnetic field; and (d) using the microscope to observe the movement of the microparticle adhered to the cell in response to the applied magnetic field, wherein the movement of the reflective microparticle adhered to the cell correlates to a property of the cell, so that a property of the cell is observed. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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27. A system for observing a property of a deformable material comprising:
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(a) a microscope capable of measuring a feature of interest in a sample; (b) a detector operatively coupled to the microscope; (c) a sample assembly comprising an observation chamber adapted to contain the deformable material; and (d) a plurality of reflective microparticles capable of adhering to the deformable material, wherein the average diameter of the reflective microparticles is between 0.5 μ
m and 30 μ
m. - View Dependent Claims (28)
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- 29. A reflective microparticle comprising a gradient index (GRIN) spherical lens.
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34. A system for obtaining an image of a cell comprising:
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(a) a interference microscope capable of extracting information from interferometric fringes; (b) a detector operatively coupled to the interference microscope; (c) a sample assembly comprising an observation chamber adapted to contain the cell, (d) a reference assembly adapted to substantially match an optical path length of the sample assembly, and (e) a plurality of reflective microparticles capable of adhering to the cell, wherein the average diameter of the reflective microparticles is between 0.5 mm and 30 mm.
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35. A method for observing a property of a deformable material, the method comprising:
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(a) adhering a reflective magnetic microparticle to the deformable material; (b) placing the deformable material in a observation chamber of a interference microscope capable of extracting information from interferometric fringes; (c) exposing the deformable material coated with the microparticle to a magnetic field; and (d) using the microscope to observe the movement of the microparticle adhered to the deformable material in response to the applied magnetic field, wherein the movement of the reflective microparticle adhered to the deformable material correlates to a property of the deformable material, so that a property of the deformable material is observed.
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36. A method for observing a property of a cell, the method comprising:
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(a) adhering a reflective magnetic microparticle to the cell; (b) placing the cell in a observation chamber of a interference microscope capable of extracting information from interferometric fringes; (c) exposing the cell coated with the microparticle to a magnetic field; and (d) using the microscope to observe the movement of the microparticle adhered to the cell in response to the applied magnetic field, wherein the movement of the reflective microparticle adhered to the cell correlates to a property of the cell, so that a property of the cell is observed.
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37. A system for observing a property of a deformable material comprising:
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(a) a microscope capable of measuring a feature of interest in a sample; (b) a detector operatively coupled to the microscope; (c) a sample assembly adapted to contain the deformable material; (d) a magnetic microparticle adhered to the deformable material; and (e) a magnetic field exerting a magnetic force on the magnetic microparticle.
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38. A system for observing a property of a deformable material comprising:
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(a) an interference microscope capable of extracting information from interferometric fringes; (b) a detector operatively coupled to the interference microscope; (c) a sample assembly adapted to contain the deformable material; (d) a reference assembly in the interference microscope adapted to substantially match an optical path length of the sample assembly; (e) a magnetic microparticle adhered to the deformable material; and (f) a magnetic field exerting a magnetic force on the magnetic microparticle.
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Specification