PATH LOSS CALCULATION METHOD USING REFLECTION PATH AS DOMINANT PATH

• US 20100286953A1
• Filed: 06/27/2008
• Published: 11/11/2010
• Est. Priority Date: 12/05/2007
• Status: Abandoned Application

• Current Assignee: Electronics and Telecommunications Research Institute
• Original Assignee: Electronics and Telecommunications Research Institute
• Inventors: Kim, Jongho, Hong, Heonjin, Kim, Chang-Joo
• Application Number:
  US12/746,424
• Publication Number:
  US 20100286953A1
• Time in Patent Office: Days
• US Class Current: 702/179
• CPC Class Codes: H04B 17/26 using historical data, averaging values or statistics
• CPC Class Codes: H04B 17/318 Received signal strength

Abstract

Provided is a method for calculating a path loss using reflection paths as dominant paths. The method includes determining a reflection plane and a reflection point in case of reflection; calculating electric field strength for the determined reflection plane and reflection point; calculating electric field strength based on a statistical loss value by diffraction according to a propagation environment in case of diffraction; and calculating a path loss based on the calculated electric field strength for reflection and the calculated electric field strength for diffraction.

Claims

1. A method for calculating a path loss for a propagation environment, comprising:

determining a reflection plane and a reflection point for reflection;

calculating electric field strength for the determined reflection plane and reflection point;

calculating electric field strength based on a statistical loss value by diffraction according to a propagation environment for diffraction; and

calculating a path loss based on the calculated electric field strength for reflection and the calculated electric field strength for diffraction.

2. The method of claim 1, wherein when the cross point is directly connected to the reception point, a path loss is calculated based the calculated electric field strength for reflection and the calculated electric field strength for diffraction.

3. The method of claim 2, further comprising:

starting to trace a propagation path according to a ray tracing method before determining the reflection plane and the reflection point for reflection.

4. The method of claim 3, wherein when the cross point is not directly connected to the reception point, said starting to trace a propagation path according to a ray tracing method is executed.

5. The method of claim 4, wherein after determining a transmission point and a reception point and designating a ray source, said starting to trace a propagation path according to a ray tracing method is executed.

6. The method of claim 4, wherein when the propagation path is a visible path, the path loss is calculated;

and

when the propagation path is not the visible path, any one of said determining a reflection plane and a reflection point and said calculating electric field strength based on a statistical loss value is executed according to reflection or diffraction in consideration of the cross point.

7. A method for calculating a path loss for a propagation environment, comprising:

determining a transmission point and a reception point and starting to trace a propagation path according to a ray tracing method;

determining a reflection plane and a reflection point for reflection and calculating electric field strength of the determined reflection plane and reflection point;

calculating electric field strength based on a statistical loss value by diffraction according to a propagation environment for diffraction; and

when the cross point is directly connected to the reception point, calculating a path loss based on the calculated electric field strength for reflection and the calculated electric field strength for diffraction.

8. The method of claim 7, wherein said determining a transmission point and a reception point and starting to trace a propagation path includes:

determining the transmission point and the reception point and designating a ray source; and

starting to trace a propagation path according to a ray tracing method.

9. The method of claim 8, wherein when the cross point is directly connected to the reception point, said designating a ray source and subsequent process are repeated.

10. The method of claim 7, wherein after executing said determining a transmission point and a reception point and starting to trace a propagation path, when the propagation path is a visible path, said calculating a path loss is executed;

and when the propagation path is not the visible path, any one of said determining a reflection plane and a reflection point for reflection and calculating electric field strength of the determined reflection plane and reflection point and said calculating electric field strength is executed.