MASS SPECTROMETRY APPARATUS AND METHOD USING THE APPARATUS

• US 20100294926A1
• Filed: 05/21/2010
• Published: 11/25/2010
• Est. Priority Date: 05/22/2009
• Status: Active Grant

• Current Assignee: Fujifilm Corporation (Fujifilm Holdings Corporation)
• Original Assignee: Fujifilm Corporation (Fujifilm Holdings Corporation)
• Inventors: MURAKAMI, Naoki
• Granted Patent: US 8,319,178 B2
• Time in Patent Office: Days
• US Class Current: 250/282
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 80/00 Applications, other than SPM, of scanning-probe techniques manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08
• CPC Class Codes: H01J 49/0004 Imaging particle spectrometry
• CPC Class Codes: H01J 49/0418 for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates

Abstract

A mass-spectrometry apparatus includes a substrate for mass spectrometry used in surface-assisted laser desorption/ionization mass spectrometry, a light irradiation means that irradiates sample S in contact with a surface of the substrate with measurement light L1 to desorb analyte R in sample S from the surface, a metal probe that generates near-field light at the leading end thereof by irradiation with measurement light L1, a detector that detects desorbed analyte. Ri, and an analysis means that performs mass spectrometry on analyte R based on a detection result by the detector. The leading end of the metal probe is arranged in such a manner that the near-field light generated by irradiation with measurement light L1 is in contact with a measurement light irradiation portion of sample S. The metal probe is arranged, with respect to the measurement light irradiation portion, at a position different from the direction of the detector.

Claims

1. A mass spectrometry apparatus comprising:

a substrate for mass spectrometry that is used in surface-assisted laser desorption/ionization mass spectrometry;

a light irradiation means that irradiates a sample that is in contact with a surface of the substrate for mass spectrometry with measurement light to desorb an analyte contained in the sample from the surface of the substrate for mass spectrometry;

a metal probe that generates near-field light at the leading end thereof by irradiation with the measurement light;

a detector that detects the desorbed analyte; and

an analysis means that performs mass spectrometry on the analyte based on a detection result by the detector, wherein the leading end of the metal probe is arranged in such a manner that the near-field light generated by irradiation with the measurement light is in contact with a measurement light irradiation portion of the sample, and wherein the metal probe is arranged, with respect to the measurement light irradiation portion of the sample, at a position in a different direction from the direction of the detector.

2. A mass spectrometry apparatus, as defined in claim 1, wherein the metal probe includes a metal microparticle that can induce localized plasmons at the leading end thereof.

3. A mass spectrometry apparatus, as defined in claim 2, wherein the metal microparticle essentially contains at least one kind of metal element selected from the group consisting of Au, Ag, Cu, Al, Pt, Ni and Ti.

4. A mass spectrometry apparatus, as defined in claim 1, further comprising:

a position control unit that relatively changes the position of the leading end of the metal probe and an irradiation position of the measurement light along XY direction, which is an in-plane direction of the substrate for mass spectrometry on which the sample is mounted.

5. A mass spectrometry apparatus, as defined in claim 4, further comprising:

an XY direction position sensor that detects the position of the metal probe with respect to XY direction; and

a display unit that displays the position of the metal probe with respect to XY direction detected by the XY direction position sensor and a result of mass spectrometry by the analysis means with the metal probe located at the position with respect to XY direction, associating them with each other.

6. A mass spectrometry apparatus, as defined in claim 1, wherein the substrate for mass spectrometry has, on a surface thereof, a microstructure having a plurality of metal bodies the sizes of which can induce localized plasmons by irradiation with the measurement light and an ionization accelerating agent adhering to at least a part of a surface of the microstructure.

7. A mass spectrometry apparatus, as defined in claim 2, wherein the substrate for mass spectrometry has, on a surface thereof, a microstructure having a plurality of metal bodies the sizes of which can induce localized plasmons by irradiation with the measurement light and an ionization accelerating agent adhering to at least a part of a surface of the microstructure.

8. A mass spectrometry apparatus, as defined in claim 6, wherein the substrate for mass spectrometry includes a dielectric having a plurality of micropores with closed bottoms that have openings on the surface of the substrate for mass spectrometry, and wherein in the microstructure, the plurality of metal bodies adhere to at least the closed bottoms of the plurality of micropores and/or to at least a part of a non-opening portion of the surface of the substrate for mass spectrometry, the non-opening portion not having the openings of the micropores.

9. A mass spectrometry apparatus, as defined in claim 7, wherein the substrate for mass spectrometry includes a dielectric having a plurality of micropores with closed bottoms that have openings on the surface of the substrate for mass spectrometry, and wherein in the microstructure, the plurality of metal bodies adhere to at least the closed bottoms of the plurality of micropores and/or to at least a part of a non-opening portion of the surface of the substrate for mass spectrometry, the non-opening portion not having the openings of the micropores.

10. A mass spectrometry apparatus, as defined in claim 6, wherein the substrate for mass spectrometry includes a dielectric having a plurality of micropores with closed bottoms that have openings on the surface of the substrate for mass spectrometry, and wherein in the microstructure, the plurality of metal bodies include loading portions, which are loaded into the plurality of micropores, and projection portions that are formed on the loading portions respectively so as to project from the surface of the substrate for mass spectrometry, the maximum diameter of each of the projection portions in a direction parallel to the surface of the substrate for mass spectrometry being greater than the diameters of respective loading portions in the direction parallel to the surface of the substrate for mass spectrometry, and wherein at least a part of the projection portions of the plurality of metal bodies are apart from each other.

11. A mass spectrometry apparatus, as defined in claim 7, wherein the substrate for mass spectrometry includes a dielectric having a plurality of micropores with closed bottoms that have openings on the surface of the substrate for mass spectrometry, and wherein in the microstructure, the plurality of metal bodies include loading portions, which are loaded into the plurality of micropores, and projection portions that are formed on the loading portions respectively so as to project from the surface of the substrate for mass spectrometry, the maximum diameter of each of the projection portions in a direction parallel to the surface of the substrate for mass spectrometry being greater than the diameters of respective loading portions in the direction parallel to the surface of the substrate for mass spectrometry, and wherein at least a part of the projection portions of the plurality of metal bodies are apart from each other.

12. A mass spectrometry apparatus, as defined in claim 10, wherein an average distance between the projection portions adjacent to each other is less than or equal to 10 nm.

13. A mass spectrometry apparatus, as defined in claim 11, wherein an average distance between the projection portions adjacent to each other is less than or equal to 10 nm.

14. A mass spectrometry apparatus, as defined in claim 6, wherein the ionization accelerating agent is an organic silicon compound.

15. A mass spectrometry apparatus, as defined in claim 1, wherein the mass spectrometry apparatus is a time-of-flight mass spectrometry apparatus including a flight direction control means provided between the substrate for mass spectrometry and the detector, and wherein the flight direction control means controls the direction of flight of the desorbed analyte and directs the desorbed analyte to a detection surface of the detector.

16. A mass spectrometry method using the mass spectrometry apparatus, as defined in claim 1, the method comprising the steps of:

irradiating a measurement portion of the sample and the leading end of the metal probe with the measurement light after the sample is placed in contact with the surface of the substrate for mass spectrometry;

desorbing the analyte contained in the sample from the surface of the substrate for mass spectrometry by the measurement light having energy enhanced by an enhanced electric field by near-field light generated at the leading end of the metal probe by irradiation with the measurement light and by an enhanced electric field induced by a surface-assisting structure on the surface of the substrate for mass spectrometry; and

capturing the desorbed analyte to perform mass spectrometry.