Device and Method for Configuring a Semiconductor Circuit

• US 20100295571A1
• Filed: 07/27/2006
• Published: 11/25/2010
• Est. Priority Date: 08/08/2005
• Status: Abandoned Application

• Current Assignee: Robert Bosch GmbH
• Original Assignee: Robert Bosch GmbH
• Inventors: Gmehlich, Rainer, Weiberle, Reinhard, Boehl, Eberhard, Mueller, Bernd, von Collani, Yorck
• Application Number:
  US11/990,095
• Publication Number:
  US 20100295571A1
• Time in Patent Office: Days
• US Class Current: 324/759.01
• CPC Class Codes: G06F 11/165 with continued operation after detection of the error

Abstract

A device and method for configuring a semiconductor circuit having at least two identical or similar functional units, the faulty unit being identified and deactivated if an error occurs in at least one of the identical or similar functional units.

Claims

1-28. -28. (canceled)

29. A method for configuring a semiconductor circuit having at least two identical or similar functional units, comprising:

identifying and deactivating a faulty one of the at least two identical or similar functional units in the event of an error in at least one of the identical or similar functional units.

30. The method as recited in claim 29, wherein the configuration of the semiconductor circuit takes place as a process step of a manufacturing, test, diagnosis, or maintenance process.

31. The method as recited in claim 29, wherein in each case, at least two of the identical or similar functional units of the semiconductor circuit are able to be switched into an operating mode in which the identical or similar functional units execute identical functions, instructions, program segments, or programs, and a comparison of the output signals of the identical or similar functional units to each other is possible.

32. The method as recited in claim 29, further comprising:

comparing output signals of the functional units to reference values to identify faulty functional units.

33. The method as recited in claim 31, wherein at least one of:

i) initiation of the switchover, ii) the comparing of the output signals of the functional units to each other, and iii) comparing of the output signals to reference values, may be executed by one of an external manufacturing device, test device, or diagnosis device that is not part of the semiconductor circuit.

34. The method as recited in claim 29, further comprising:

forming at least one of a configuration status and an error status for at least the functional units of the semiconductor circuit that are identified as faulty.

35. The method as recited in claim 34, wherein the deactivating includes storing information about the at least one of the configuration status and the error status of the faulty functional unit in a memory device such that the information may be read out when the semiconductor system is being at least one of initialized and operated, and the stored information is processed such that a use of the faulty unit in operation is not allowed.

36. The method as recited in claim 35, wherein one of an external manufacturing device, a test device, or a diagnosis device that is not part of the semiconductor circuit is used to ascertain or store in a memory device the at least one of the configuration status and the error status of at least one functional unit of the semiconductor circuit.

37. The method as recited in claim 29, wherein a faulty unit is irreversibly deactivated.

38. The method as recited in claim 37, wherein electric connections to or between functional units of the semiconductor circuit are interrupted to deactivate the faulty unit.

39. The method as recited in claim 38, wherein the electrical connections on the semiconductor circuit are interrupted by mechanical action on the semiconductor circuit.

40. The method as recited in claim 38, wherein the electrical connections on the semiconductor circuit are interrupted by chemical action on the semiconductor circuit.

41. The method as recited in claim 38, wherein the electrical connections on the semiconductor circuit are interrupted by optical action on the semiconductor circuit.

42. The method as recited in claim 38, wherein the electrical connections on the semiconductor circuit are interrupted by electric action on the semiconductor circuit.

43. The method as recited in claim 37, wherein the faulty unit is deactivated by one of an external manufacturing device, a test device, or a diagnosis device.

44. A device for configuring a semiconductor circuit having at least two identical or similar functional units, comprising:

an arrangement adapted to identify an error in at least one of the identical or similar functional units and to deactivate a faulty one of the identical or similar functional units if an error is identified.

45. The device as recited in claim 44, further comprising:

a switchover device with which at least two of the identical or similar functional units of the semiconductor circuit may be switched over into an operating mode in which the at least two of the identical or similar functional units execute identical functions, instructions, program segments, or programs.

46. The device as recited in claim 44, further comprising:

a comparitor adapted to compare output signals of at least two of the identical or similar functional units to each other.

47. The device as recited in claim 44, further comprising:

a comparitor adapted to compare output signals of at least one functional unit to reference values.

48. The device as recited in claim 44, further comprising:

a storage device adapted to store reference values for identifying faulty functional units.

49. The device as recited in claim 46, wherein the comparitor is at least partially on the semiconductor circuit.

50. The device as recited in claim 44, further comprising:

a receiver on the semiconductor circuit with which signals from one of a manufacturing device, a test device, a diagnosis device, or a maintenance device may be received.

51. The device as recited in claim 47, wherein the comparitor is at least partially on the semiconductor circuit.

52. The device as recited in claim 48, wherein the storage device is at least partially on the semiconductor circuit.

53. The device as recited in claim 44, further comprising:

a storage device adapted to store at least one item of information about one of a configuration status or error status of functional units in such a way that the one of the configuration status or error status may be read out when the semiconductor system is being at least one of initialized or operated.

54. The device as recited in claim 53, further comprising:

an element adapted to read out and process memory information and as a function of the memory information, permit or prevent in operation a use of a faulty unit.

55. The device as recited in claim 53, wherein the storage device is a non-volatile storage device.

56. The device as recited in claim 53, wherein the memory device is adapted so that a write access to the memory device may be carried out only by one of a manufacturing device, test device, diagnosis device, and maintenance device that is not installed on the semiconductor circuit.

57. The device as recited in claim 44, further comprising:

a switchover device adapted to reversibly deactivate a functional unit, the switchover device being a part of the semiconductor circuit or part of a structural element on which the semiconductor circuit is implemented.

58. The device as recited in claim 44, further comprising:

a switchover device adapted to irreversibly deactivate a faulty functional unit.