WAVELENGTH TRACKER FOR SWEPT WAVELENGTH SENSOR INTERROGATION SYSTEM

• US 20100296089A1
• Filed: 02/27/2009
• Published: 11/25/2010
• Est. Priority Date: 02/27/2009
• Status: Active Grant

• Current Assignee: Corning Incorporated
• Original Assignee: Corning Incorporated
• Inventors: Webb, Michael B., Wu, Qi
• Granted Patent: US 8,049,883 B2
• Time in Patent Office: Days
• US Class Current: 356/326
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0208 using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
• CPC Class Codes: G01J 3/2803 using photoelectric array detector
• CPC Class Codes: G01J 3/4338 Frequency modulated spectrometry
• CPC Class Codes: G01N 21/7743 the reagent-coated grating coupling light in or out of the waveguide

Abstract

A swept wavelength interrogation system includes a tunable light source for outputting a light beam that is tunable over a range of wavelengths and an optical reader head for distributing the light beam among a plurality of sensors and for measuring response spectra from the sensors. A wavelength-tracking device measures centroid wavelengths of the light beam. A processor calculates a centroid wavelength of the response spectra from the sensors based on the measured centroid wavelengths of the light beam.

Claims

1. A swept wavelength interrogation system comprising:

a tunable light source having a light beam tunable over a range of wavelengths;

an optical reader to distribute the light beam among a plurality of sensors and for measuring response spectra from the sensors; and

a wavelength-tracking device to measure centroid wavelengths of the light beam with a given precision,

the light beam having a linewidth that exceeds the given precision of the measured centroid wavelengths.

2. The system of claim 1 wherein the linewidth of the light beam exceeds the given precision of the measured centroid wavelengths by a factor of about 10 or more.

3. The system of claim 2 wherein the linewidth of the light beam is about 10 picometers or more and the given precision of the measured centroid wavelengths is less than about one picometer.

4. The system of claim 1 wherein the wavelengths of the light beam are spaced by a nominal step size and the linewidth of the light beam exceeds the nominal step size.

5. The system of claim 1 wherein the sensors have a resonance width and the linewidth of the light beam being greater than about five percent of the resonance width of the sensors.

6. The system of claim 5 wherein the linewidth of the light beam approaches the resonance width of the sensors.

7. The system of claim 1 wherein the tunable light source is a multi-longitudinal mode laser that simultaneously oscillates in a multitude of different longitudinal modes to enlarge the linewidth of the light beam.

8. The system of claim 7 wherein the multi-longitudinal mode laser simultaneously oscillates in about 100 or more longitudinal modes to reduce the influence of mode hopping.

9. The system of claim 1 further comprising a processor for determining centroid wavelengths of the sensor response spectra.

10. The system of claim 9 wherein the centroid wavelengths of the sensor response spectra have a measurement error σ

_c according to;

σ

_C=√

{square root over (σ

_λ

+σ

_Y)}

where σ

_λ

is a measurement error of the centroid wavelengths of the light beam and σ

_Y is a measurement error of the response from the sensors.

11. The system of claim 1 wherein the measurement error σ

_c is about 100 femtometers or less, and the measurement error σ

_λ

is about 0.3 picometers or less.

13. The apparatus of claim 1 wherein the centroid wavelength of sensor resonance is based on the centroid wavelengths of the light beam and the energy contents of the light beam returning from the sensor.

14. The apparatus of claim 1 wherein both the centroid wavelengths of the light beam and the centroid wavelength of sensor resonance represent a weighted mean of a plurality of wavelengths weighted according to the optical energy content of the wavelengths.

15. The apparatus of claim 1 wherein the wavelengths for determining the centroid wavelength of sensor resonance are the measured centroid wavelengths of the light beam.

16. The apparatus of claim 1 wherein the light beam has a linewidth of at least 10 picometers, and the sensor system is arranged for spatially distinguishing among the centroid wavelengths of the light beam to a precision of less than about 1 picometer.

12. A wavelength tracking apparatus of a swept wavelength sensor interrogation system to measure a centroid wavelength of sensor resonance, comprising:

a dispersive optic that alters a spatial position of a light beam as a function of the beam'"'"'s wavelength;

a sensor that measures optical power as a function of the spatial position of the light beam, and

a processor that converts the measured optical power to a measure of the centroid wavelength of the light beam, and the measured centroid wavelength being used to calculate the centroid wavelength (C_k) of the sensor resonance.

17. A method of interrogating an array of sensors to measure a response to an analyte proximate to the sensor, comprising:

tuning a light source to provide a light beam having a range of wavelengths,

splitting the light beam to a beam-monitoring pathway and a sensor-interrogating pathway,

measuring centroid wavelengths of the light beam along the beam-monitoring pathway,

distributing optical power of the light beam among the array of sensors along the sensor-interrogating pathway,

measuring optical power returning from the array of sensors, and

determining centroid wavelengths of response spectra from the sensors based on the measured centroid wavelengths of the light beam and on the measured optical power returning from the array of sensors.

18. The method of claim 17 wherein both the centroid wavelengths of the light beam and the centroid wavelengths of the response spectra from the sensors represent a weighted mean of a plurality of considered wavelengths weighted according to optical energy content of the considered wavelengths.

19. The method of claim 17 wherein the centroid wavelengths of the light beam are measured with a given precision and the light beam has a linewidth that exceeds the given precision with which the centroid wavelengths of the light beam are measured.

20. The method of claim 17 wherein tuning includes outputting the light beam as multi-longitudinal mode beam containing at least 100 different longitudinal modes that vary in modal content over the range of wavelengths of the light beam.

21. The method of claim 17 wherein the measuring includes

altering a spatial position of the light beam as a function of the wavelength of the light beam,

measuring optical power in reference to the spatial position of the light beam, and

converting the optical power measured in reference to the spatial position of the light beam into a measure of the centroid wavelength of the light beam.