METHODS AND DEVICES FOR READING MICROARRAYS
First Claim
Patent Images
1. A method for imaging a probe array, the method comprising:
- (a) providing a surface on the probe array, wherein the probe array surface comprises a plurality of fiducials;
(b) a camera, wherein the camera can be moved in the z direction;
(c) an x and y stage, wherein the stage can be moved in the x and y directions;
(d) measuring an x, y, and z positions of the plurality of fiducials that are on the surface of the array, wherein the measuring step comprises;
providing an x-y and z home positions, wherein the x-y home position is a home stage position of an x, y stage and the z home position is a home camera position of the camera;
focusing on a fiducial on the surface of the probe array, wherein the focusing step comprises moving the camera and stage to the fiducial being measured;
determining the x and y distances traveled from the x-y home position to the x and y position of the fiducial to obtain a measured x-y data;
determining the z distance moved from the z home position to the z position of the fiducial to obtain a measured z data;
repeating the above providing, focusing and determining steps until each fiducial is measured;
(e) transmitting the measured x-y, and z measurement data to a computer, wherein the computer comprises a surface fitting algorithm;
(f) calculating a surface profile, wherein the calculating step is performed on the computer employing the surface fitting algorithm and the transmitted measurement data;
(g) adjusting one or more surface non-flatness parameters, wherein the surface non-flatness parameters are parameters that can be changed to improve the image flatness of the surface; and
repeating steps (d) to (g) until the relative distance of each fiducial on the probe array are positionally optimized for setting up the probe array to be imaged.
3 Assignments
0 Petitions
Accused Products
Abstract
In one embodiment of the invention, a method to image a probe array is described that includes focusing on a plurality of fiducials on a surface of an array. The method utilizes obtaining the best z position of the fiducials and using a surface fitting algorithm to produce a surface fit profile. One or more surface non-flatness parameters can be adjusted to improve the flatness image of the array surface to be imaged.
25 Citations
21 Claims
-
1. A method for imaging a probe array, the method comprising:
-
(a) providing a surface on the probe array, wherein the probe array surface comprises a plurality of fiducials; (b) a camera, wherein the camera can be moved in the z direction; (c) an x and y stage, wherein the stage can be moved in the x and y directions; (d) measuring an x, y, and z positions of the plurality of fiducials that are on the surface of the array, wherein the measuring step comprises; providing an x-y and z home positions, wherein the x-y home position is a home stage position of an x, y stage and the z home position is a home camera position of the camera; focusing on a fiducial on the surface of the probe array, wherein the focusing step comprises moving the camera and stage to the fiducial being measured; determining the x and y distances traveled from the x-y home position to the x and y position of the fiducial to obtain a measured x-y data; determining the z distance moved from the z home position to the z position of the fiducial to obtain a measured z data; repeating the above providing, focusing and determining steps until each fiducial is measured; (e) transmitting the measured x-y, and z measurement data to a computer, wherein the computer comprises a surface fitting algorithm; (f) calculating a surface profile, wherein the calculating step is performed on the computer employing the surface fitting algorithm and the transmitted measurement data; (g) adjusting one or more surface non-flatness parameters, wherein the surface non-flatness parameters are parameters that can be changed to improve the image flatness of the surface; and repeating steps (d) to (g) until the relative distance of each fiducial on the probe array are positionally optimized for setting up the probe array to be imaged. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. A method of manufacturing a filter slider for reading a biological array, the method comprising:
-
(a) providing a linear slide; (b) providing a plurality of filter sets, wherein the filter sets are mounted in a filter block that is mounted on the linear slide; (c) providing a linear actuator, wherein the linear actuator comprises a motor; and (d) coupling the linear actuator to the linear slide such that the filer slider functions properly even if the linear actuator is misaligned relative to the linear slide. - View Dependent Claims (11, 12)
-
-
13. A method for imaging a probe array, the method comprising:
-
a) providing a surface on the probe array, wherein the probe array surface comprises a plurality of fiducials; b) a camera, wherein the camera can be moved in the z direction; c) determining a best z position of at least one fiducial on the surface of the array; d) taking a plurality of images at a plurality of z positions of the fiducial, wherein the z positions are different, wherein an image with the best z position and a plurality of images without the best z position are obtained; e) determining how sharp the plurality of images are at each z position by using an image software package; f) choosing the image with the best z position, wherein the best z position provides an image that is sharper compared to the plurality of images without the best z positions; g) repeating steps (a) to (f) until the best z position of each fiducial on the probe array is determined; h) transmitting the best z position data of the plurality of fiducials to a computer, wherein the computer comprises a surface fitting algorithm; i) calculating a surface fit profile, wherein the calculating step is performed on the computer employing the surface fitting algorithm and the best z position data; j) adjusting one or more surface non-flatness parameters based on the calculations of the surface fit profile, wherein the surface non-flatness parameters are parameters that can be changed to improve the image flatness of the surface image; and k) repeating steps (g) to (j) to obtain an image of the probe array. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21)
-
Specification