RADIO FREQUENCY MICROSCOPE FOR AMPLIFYING AND ANALYZING ELECTROMAGNETIC SIGNALS
First Claim
1. A method for analyzing a target electromagnetic signal radiating from a monitored system, comprising:
- positioning the monitored system at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface;
monitoring the amplified target electromagnetic signal using an antenna positioned at the second locus of the ellipsoidal surface; and
assessing the integrity of the monitored system by analyzing the amplified target electromagnetic signal monitored by the antenna.
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Accused Products
Abstract
One embodiment provides a technique for analyzing a target electromagnetic signal radiating from a monitored system. During the technique, the monitored system is positioned at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface. Next, the amplified target electromagnetic signal is monitored using an antenna positioned at the second locus of the ellipsoidal surface. Finally, the integrity of the monitored system is assessed by analyzing the amplified target electromagnetic signal monitored by the antenna.
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Citations
20 Claims
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1. A method for analyzing a target electromagnetic signal radiating from a monitored system, comprising:
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positioning the monitored system at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface; monitoring the amplified target electromagnetic signal using an antenna positioned at the second locus of the ellipsoidal surface; and assessing the integrity of the monitored system by analyzing the amplified target electromagnetic signal monitored by the antenna. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system for analyzing a target electromagnetic signal radiating from a monitored system, comprising:
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an ellipsoidal surface; a positioning apparatus configured to position the monitored system at a first locus of the ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface; an antenna positioned at the second locus of the ellipsoidal surface, wherein the antenna is configured to monitor the amplified target electromagnetic signal; and an analysis apparatus configured to assess the integrity of the monitored system by analyzing the amplified target electromagnetic signal monitored by the antenna. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification