SYSTEM FOR TESTING POWER SUPPLY UNIT

• US 20100315749A1
• Filed: 09/11/2009
• Published: 12/16/2010
• Est. Priority Date: 06/11/2009
• Status: Active Grant

• Current Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Inventors: WU, KUN-LUNG, XIE, LING-YU, HUANG, SHENG-CHUNG
• Granted Patent: US 8,305,107 B2
• Time in Patent Office: Days
• US Class Current: 361/91.1
• CPC Class Codes: G01R 31/40 Testing power supplies testing photovoltaic devices H02S50/10

Abstract

A system for testing a power supply unit includes a test sub-system and a test control sub-system connected to the test sub-system and the power supply unit. The test sub-system perform tests and record the results. The test control sub-system is capable of selecting test items to test the power supply unit and setting an execution sequence of the test items. The test items includes a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state. The test control sub-system is further capable of automatically switching the standby test item to the normal test item, and switching the normal test item to the over temperature protection test item.

Claims

1. A system for testing a power supply unit comprising:

a test sub-system for performing test and recording test results; and

a test control sub-system connected to the test sub-system and the power supply unit, the test control sub-system capable of selecting test items to test the power supply unit and setting an execution sequence of the test items;

wherein the test items comprises a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state;

the test control sub-system is capable of automatically switching the standby test item to the normal test item after a first predetermined time period for executing the standby test item, and switching the normal test item to the over temperature protection test item after a second predetermined time period for executing the normal test item.

2. The system as described in claim 1, wherein the test control sub-system comprises a microcontroller unit connected to the test sub-system and the power supply unit.

3. The system as described in claim 2, wherein the test control sub-system further comprises an alternating current (AC) voltage level switch circuit connected to the microcontroller unit, the AC voltage level switch circuit comprises a first switch member controlled by the microcontroller unit for enabling the power supply unit to be operated at a voltage level mode complying with a voltage level of the AC source supplied to the power supply unit.

4. The system as described in claim 2, wherein the test control sub-system further comprises an AC On/Off switch circuit connected to the microcontroller unit, the AC On/Off switch circuit comprises a second switch member controlled by the microcontroller unit and configured to switch on or off an AC source fed to the power supply unit.

5. The system as described in claim 2, wherein the test control sub-system further comprises a Power supply unit On (PSON) signal switch circuit connected to the microcontroller unit, the PSON signal switch circuit is controlled by the microcontroller unit and configured to switch a PSON signal on the power supply unit between a low level and a high level.

6. The system as described in claim 5, wherein the test control sub-system further comprises a fan switch circuit for switching on or off a fan of the power supply unit thereby enabling the power supply unit at the over heated state during executing the over temperature protection test item.

7. The system as described in claim 2, wherein the test control sub-system further comprises an alarm circuit connected to the microcontroller unit, the alarm circuit includes a speaker capable of sending out an alarming signal when the test ends or an error occurs during testing the power supply unit.

8. The system as described in claim 2, wherein the test control sub-system further comprises a scanning signal sending circuit connected to the microcontroller unit for generating a scanning signal to the test sub-system for recording test data periodically.

9. The system as described in claim 2, wherein the test control sub-system further comprises an AC source detection circuit connected to the microcontroller unit, the AC source detection circuit is capable of sending an AC On/Off signal and an AC voltage level signal to the microcontroller unit to inform the microcontroller unit whether the AC source is switched on/off and whether the AC voltage is at a second high level or a second high level.

10. The system as described in claim 2, wherein the test control sub-system further comprises a clock signal generating circuit connected to the microcontroller unit for providing a precise clock signal to the microcontroller unit, a power good signal of the power supply unit is amplified by an amplifier of the clock signal generating circuit and sent to the microcontroller unit.

11. The system as described in claim 2, wherein a selection switch is connected to the microcontroller unit for selecting a first test procedure or a second test procedure to test the power supply unit;

when the first test procedure is selected to test the power supply unit, cycle numbers of the test items is ten; and

when the second test procedure is selected to test the power supply unit, cycles numbers of the test items is fifteen.

12. A system for testing a power supply unit comprising:

a test sub-system connected to the power supply unit; and

a test control sub-system coupled to the test sub-system and the power supply unit, the test control sub-system comprising a microcontroller unit capable of automatically switching On/Off an AC source applied to the power supply unit, switching On/Off a PSON signal fed to the power supply unit, and switching On/Off a fan of the power supply unit for providing a normal and an overheated environment to the power supply unit.

13. The system as described in claim 12, wherein an AC source detection circuit is connected to the microcontroller unit for informing the microcontroller unit whether the AC source is switched on or off and whether a voltage level of the AC source fed to the power supply unit is at a first high level or a second high level.

14. The system as described in claim 13, wherein the AC source detection circuit comprises a first chip capable of comparing a signal detected from the AC source with a first threshold voltage or a second threshold voltage to determine whether the AC source is switched on or off and determine whether the voltage level of the AC source fed to the power supply unit is at the first high level or the second high level.

15. The system as described in claim 14, wherein the first threshold voltage is 2.5V, and the second threshold is 160V;

if a voltage of the detected AC signal is greater than 4V, a first output terminal of the AC source detection circuit is capable of sending a high level signal to the microcontroller unit to inform the microcontroller unit the AC source is switched on;

if the AC source is switched on, and the voltage of the detected AC signal does not exceed 160V, a second output terminal of the AC source detection circuit is capable of sending a low level signal to the microcontroller unit to inform the microcontroller unit that the AC source is at the first high level;

if the voltage of the detected AC signal exceeds 160V, the second output terminal of the AC source detection circuit is capable of sending a high level signal to the microcontroller unit to inform the microcontroller unit that the AC source is at the second high level.

16. The system as described in claim 14, wherein an AC voltage level switch circuit is connected to the microcontroller unit and comprises a switch member controlled by the microcontroller unit, the switching member is switched on if the AC source is detected at the second high level.

17. The system as described in claim 12, wherein a clock signal generating circuit is connected to the microcontroller unit for providing a precise clock signal to the microcontroller unit, the clock signal generating circuit comprises a chip capable of amplifying a power good signal of the power supply unit and sending the amplified power good signal to the microcontroller unit.

18. The system as described in claim 12, wherein the test control sub-system further comprises an alarm circuit connected to the microcontroller unit, the alarm circuit comprises a speaker capable of sending out an alarming signal when the test ends or an error occurs during testing the power supply unit.

19. The system as described in claim 12, wherein the test control sub-system further comprises a scanning signal sending circuit connected to the microcontroller unit for generating a scanning signal to the test sub-system for recording test data periodically.

20. The system as described in claim 12, wherein a selection switch is connected to the microcontroller unit for selecting a first test procedure or a second test procedure to test the power supply unit;

if the first test procedure is selected to test the power supply unit, a total test period is 10 hours; and

if the second test procedure is selected to test the power supply unit, a total test period is 15 hours.