INCLUSIVE OR BIT MATRIX TO COMPARE MULTIPLE CORRESPONDING SUBFIELDS
First Claim
Patent Images
1. A method of comparing subfields of two data elements, the method comprising:
- loading a bit matrix with one or more subfields of a first bit string to be searched;
loading a second bit string with a reference bit string; and
executing a bit matrix compare operation on the reference pattern bit string and one or more subfields of the first bit string stored in the bit matrix to form a bit matrix compare result indicating whether the reference bit pattern matches one or more of the subfields.
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Abstract
A computer system is operable to identify subfields that differ in two data elements using a bit matrix compare function between a first matrix filled with pattern elements and a reference pattern.
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Citations
18 Claims
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1. A method of comparing subfields of two data elements, the method comprising:
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loading a bit matrix with one or more subfields of a first bit string to be searched; loading a second bit string with a reference bit string; and executing a bit matrix compare operation on the reference pattern bit string and one or more subfields of the first bit string stored in the bit matrix to form a bit matrix compare result indicating whether the reference bit pattern matches one or more of the subfields. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A computerized system, operable to:
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load a bit matrix with one or more subfields of a first bit string to be searched; load a second bit string with a reference bit string; and execute a bit matrix compare operation on the reference pattern bit string and one or more subfields of the first bit string stored in the bit matrix to form a bit matrix compare result indicating whether the reference bit pattern matches one or more of the subfields. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A method of comparing data elements, comprising:
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loading a bit matrix with one or more patterns defining one or more subfields; and executing a bit matrix compare operation between the one or more patterns defining one or more subfields and a reference subfield to form a result identifying whether the reference subfield matches the one or more patterns. - View Dependent Claims (18)
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Specification